In Xyce 7.8 local sampling appears to fail when the parameter is passed to a transistor model parameter.
The following gaussian definition is used:
.PARAM DVTN_LV= agauss(0,'avtn_lv/sqrt(w*l*mult)',1)
.PARAM MULTN_LV=agauss(0,'aidn_lv/sqrt(w*l*mult)',1)
In the following transistor definition the variation im "M" fails to sample correctly treats it as a global variation, whereas W samples correctly treated as a local variation.
-------
Mint d g s b nlv
+ M='(1*nf)+multn_lv' AD='ad/nf' AS='as/nf' L='l' NRD='nrd*nf' NRS='nrs*nf'
+ PD='pd/nf' PS='ps/nf' W='wf+wf*multn_lv'
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In addition within the model the following call is treated as global.
-------
.MODEL nlv.1 NMOS
.....
+VTH0='0.5447+skew_lv_vtn + DVTN_LV'
......
+ LEVEL=9
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