I wish to be able to incorporate uncertainty into some of the material measurements such as Split Post Dielectric Resonators (SPDR) and Free Field Focus Beam measurements. The calibration options within VNA Tools do not allow me from what I understand to apply these specific calibrations. In fact the SPDR data is un-calibrated and a qfactor and frequency shift is used to determine the materials. In fact what I require is something more simple which is the ability to propagate the uncertainty none error corrected data.
In the pursuit of this I looked at taking the VNA device and Journal and raw uncalibrated raw measured files and populating them with corresponding Jacobi dependencies.
To start this I wanted a simple example to compare. Using the TransNorm and RefNorm I should be able to generate this to force the normalisation to be 1.0.
Attached is some notes with some questions. My main question is comes from my conclusion that VNATools applies a sqrt(time) scaling function for drift. Is this correct? After doing some drift analysis using some of our analysers suggests this may be too aggressive.