Paper for this week
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paul
Sep 29, 2008, 11:49:29 PM9/29/08
to VLSI/Circuits Reading Group
The paper for this week:
Silicon Odometer: An On-Chip Reliability Monitor for Measuring
Frequency Degradation of Digital Circuits
http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4476475&arnumber=4476494
Silicon Odometer: An On-Chip Reliability Monitor for Measuring
Frequency Degradation of Digital Circuits
http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4476475&arnumber=4476494
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