Hello,
I am interested in using the MCCL program to provide angle-resolved diffuse reflectance at the surface of a medium. As there is not an existing detector that does this, I have two different ideas for achieving this.
The first method is to use a radiance detector (with X, Y, Z, theta, and phi resolved detection). However, the radiance detector only appears to count photons which undergo some scattering or absorption event within the hypervoxel. Can you confirm that this is how the radiance detection is conducted? Alternatively, is there a way to modify either the radiance or diffuse reflectance detector to angularly resolve the light leaving the surface of the sample?
A second method is based on enumeration of the photons. In this case, a diffuse reflectance detector can be placed first at the surface, and second at some arbitrary location above the first. If the photons can be enumerated, those which travel through both the surface detector and the second detector can be preferentially selected, while ignoring the rest. In this way, the spatial image of photons exiting the sample surface that also meet the second detector region can be reconstructed. However, I'm unsure if 1.) this type of enumerated photon data is stored within the PostProcessor/pMC database files, and 2.) what the format of these files is (to parse out that information).
I would greatly appreciate any insight from the VTS/MCCL managers on whether either of these methods would be preferable or if there are any better alternatives.
Thank you,
-Will