Ftir Spectroscopy Pdf

[Nakita Heitmann]

Fouriertransform infrared spectroscopy (FTIR)[1] is a technique used to obtain an infrared spectrum of absorption or emission of a solid, liquid, or gas. An FTIR spectrometer simultaneously collects high-resolution spectral data over a wide spectral range. This confers a significant advantage over a dispersive spectrometer, which measures intensity over a narrow range of wavelengths at a time.

Fourier-transform spectroscopy is a less intuitive way to obtain the same information. Rather than shining a monochromatic beam of light (a beam composed of only a single wavelength) at the sample, this technique shines a beam containing many frequencies of light at once and measures how much of that beam is absorbed by the sample. Next, the beam is modified to contain a different combination of frequencies, giving a second data point. This process is rapidly repeated many times over a short time span. Afterwards, a computer takes all this data and works backward to infer what the absorption is at each wavelength.[2]

In a Michelson interferometer adapted for FTIR, light from the polychromatic infrared source, approximately a black-body radiator, is collimated and directed to a beam splitter. Ideally 50% of the light is refracted towards the fixed mirror and 50% is transmitted towards the moving mirror. Light is reflected from the two mirrors back to the beam splitter and some fraction of the original light passes into the sample compartment. There, the light is focused on the sample. On leaving the sample compartment the light is refocused on to the detector. The difference in optical path length between the two arms to the interferometer is known as the retardation or optical path difference (OPD). An interferogram is obtained by varying the retardation and recording the signal from the detector for various values of the retardation. The form of the interferogram when no sample is present depends on factors such as the variation of source intensity and splitter efficiency with wavelength. This results in a maximum at zero retardation, when there is constructive interference at all wavelengths, followed by series of "wiggles". The position of zero retardation is determined accurately by finding the point of maximum intensity in the interferogram. When a sample is present the background interferogram is modulated by the presence of absorption bands in the sample.[2]

Commercial spectrometers use Michelson interferometers with a variety of scanning mechanisms to generate the path difference. Common to all these arrangements is the need to ensure that the two beams recombine exactly as the system scans. The simplest systems have a plane mirror that moves linearly to vary the path of one beam. In this arrangement the moving mirror must not tilt or wobble as this would affect how the beams overlap as they recombine. Some systems incorporate a compensating mechanism that automatically adjusts the orientation of one mirror to maintain the alignment. Arrangements that avoid this problem include using cube corner reflectors instead of plane mirrors as these have the property of returning any incident beam in a parallel direction regardless of orientation.

Systems where the path difference is generated by a rotary movement have proved very successful. One common system incorporates a pair of parallel mirrors in one beam that can be rotated to vary the path without displacing the returning beam. Another is the double pendulum design where the path in one arm of the interferometer increases as the path in the other decreases.

A quite different approach involves moving a wedge of an IR-transparent material such as KBr into one of the beams. Increasing the thickness of KBr in the beam increases the optical path because the refractive index is higher than that of air. One limitation of this approach is that the variation of refractive index over the wavelength range limits the accuracy of the wavelength calibration.

The interferogram has to be measured from zero path difference to a maximum length that depends on the resolution required. In practice the scan can be on either side of zero resulting in a double-sided interferogram. Mechanical design limitations may mean that for the highest resolution the scan runs to the maximum OPD on one side of zero only.

The interferogram is converted to a spectrum by Fourier transformation. This requires it to be stored in digital form as a series of values at equal intervals of the path difference between the two beams. To measure the path difference a laser beam is sent through the interferometer, generating a sinusoidal signal where the separation between successive maxima is equal to the wavelength of the laser (typically a 633 nm HeNe laser is used). This can trigger an analog-to-digital converter to measure the IR signal each time the laser signal passes through zero. Alternatively, the laser and IR signals can be measured synchronously at smaller intervals with the IR signal at points corresponding to the laser signal zero crossing being determined by interpolation.[6] This approach allows the use of analog-to-digital converters that are more accurate and precise than converters that can be triggered, resulting in lower noise.

For rapid calculation the number of points in the interferogram has to equal a power of two. A string of zeroes may be added to the measured interferogram to achieve this. More zeroes may be added in a process called zero filling to improve the appearance of the final spectrum although there is no improvement in resolution. Alternatively, interpolation after the Fourier transform gives a similar result.[citation needed]

Another minor advantage is less sensitivity to stray light, that is radiation of one wavelength appearing at another wavelength in the spectrum. In dispersive instruments, this is the result of imperfections in the diffraction gratings and accidental reflections. In FT instruments there is no direct equivalent as the apparent wavelength is determined by the modulation frequency in the interferometer.

FTIR is a method of measuring infrared absorption and emission spectra. For a discussion of why people measure infrared absorption and emission spectra, i.e. why and how substances absorb and emit infrared light, see the article: Infrared spectroscopy.

Far-IR spectrometers commonly use pyroelectric detectors that respond to changes in temperature as the intensity of IR radiation falling on them varies. The sensitive elements in these detectors are either deuterated triglycine sulfate (DTGS) or lithium tantalate (LiTaO3). These detectors operate at ambient temperatures and provide adequate sensitivity for most routine applications. To achieve the best sensitivity the time for a scan is typically a few seconds. Cooled photoelectric detectors are employed for situations requiring higher sensitivity or faster response. Liquid nitrogen cooled mercury cadmium telluride (MCT) detectors are the most widely used in the mid-IR. With these detectors an interferogram can be measured in as little as 10 milliseconds. Uncooled indium gallium arsenide photodiodes or DTGS are the usual choices in near-IR systems. Very sensitive liquid-helium-cooled silicon or germanium bolometers are used in the far-IR where both sources and beamsplitters are inefficient.[citation needed]

Attenuated total reflectance (ATR) is one accessory of FTIR spectrophotometer to measure surface properties of solid or thin film samples rather than their bulk properties. Generally, ATR has a penetration depth of around 1 or 2 micrometers depending on sample conditions.

The interferogram in practice consists of a set of intensities measured for discrete values of retardation. The difference between successive retardation values is constant. Thus, a discrete Fourier transform is needed. The fast Fourier transform (FFT) algorithm is used.

The near-infrared region spans the wavelength range between the rock-salt region and the start of the visible region at about 750 nm. Overtones of fundamental vibrations can be observed in this region. It is used mainly in industrial applications such as process control and chemical imaging.

FTIR can be used in all applications where a dispersive spectrometer was used in the past (see external links). In addition, the improved sensitivity and speed have opened up new areas of application. Spectra can be measured in situations where very little energy reaches the detector aaurier transform infrared spectroscopy is used in geology,[11] chemistry, materials, botany[12] and biology research fields.[13]

FTIR is also used to investigate various nanomaterials and proteins in hydrophobic membrane environments. Studies show the ability of FTIR to directly determine the polarity at a given site along the backbone of a transmembrane protein.[14][15] The bond features involved with various organic and inorganic nanomaterials and their quantitative analysis can be done with the help of FTIR.[16][17]

An infrared microscope allows samples to be observed and spectra measured from regions as small as 5 microns across. Images can be generated by combining a microscope with linear or 2-D array detectors. The spatial resolution can approach 5 microns with tens of thousands of pixels. The images contain a spectrum for each pixel and can be viewed as maps showing the intensity at any wavelength or combination of wavelengths. This allows the distribution of different chemical species within the sample to be seen[citation needed]. This technique has been applied in various biological applications including the analysis of tissue sections as an alternative to conventional histopathology,[citation needed] examining the homogeneity of pharmaceutical tablets[citation needed], and for differentiating morphologically-similar pollen grains.[18]

The spatial resolution of FTIR can be further improved below the micrometer scale by integrating it into scanning near-field optical microscopy platform. The corresponding technique is called nano-FTIR and allows for performing broadband spectroscopy on materials in ultra-small quantities (single viruses and protein complexes) and with 10 to 20 nm spatial resolution.[19]

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