
Dear Amos
I had a chance to access your paper (Amos Egel et al 2017 J. Opt. 19 025605) and got interested. For few days I attempted to follow your demo of specular/diffuse reflection of nano-strucutred OLED thin film stacks.
However, there seems to be some misunderstanding of mine about SMUTHI. As far as I'm concerned, the intensity of the reflected ray is at its maximum at specular reflection direction (=incident angle). But the value I_beta_j (azimuthal_integral_times_sin_beta) doesn't agree with the above and was at maximum elsewhere.
The incident beam's polar angle was 3/5 * pi, and the reflected beam's maximum value was detected at 34.5 degree (0.191666 pi). From what I've thought, the maximum should have been at 2/5 *pi but it wasn't. I think I have confused/missed something badly and I need some help.
For detailed information, I include some snapshots.
(If it is okay for you to provide your code, that would be really thankful.)
Thanks
Jaebum Noh.