[29] J. Ruefenacht, M. Wollensack, J. Hoffmann, D. Stalder, M. Zeier.
S-Parameter traceability up to 110 GHz – practical aspects.
European Metrology Workshop (Keysight), Prague, 07.04.2017.
This presentation can be downloaded from:
https://www.researchgate.net/publication/316601381_S-Parameter_traceability_up_to_110_GHz_-_practical_aspects