VNA Tools discussion forum
METAS S-Parameter Metrology
METAS S-Parameter Metrology
This free VNA metrology application was
originally developed for National Metrology Institutes and high level industry
laboratories but we do see now an increased interest from industry, accredited
laboratories and academia. One of the reasons is to have access to a complete
uncertainty budget and therefore being able to identify the main error sources
(where to put the resources to increase the accuracy). The other reason is to
compare the impact on accuracy by applying different calibration methods or
calibration standard definitions on exactly the same S-parameter raw data.
In addition it allows to save a lot of time for any accredited lab for the
measurements and the needed quality management documentations. Just to come up
with your best measurement capability calculations (needed for the scope of
accreditation) allows you to save weeks of work compared to use the existing
techniques. Other new implemented features are time domain conversion, material
characterization calculations (complex permittivity and permeability) and mixed
mode S-parameter conversions – all with linear uncertainty propagation. VNA
Tools does support coaxial, waveguide and on-wafer S-parameter measurements.
Even a virtual VNA is built in to create artificial measurements – this is very
convenient for educational purposes as no VNA hardware is needed to demonstrate the
S-parameter metrology and the different possible calibration methods.
METAS S-Parameter Metrology
VNA Tools is a powerful but sophisticated software. In order to unleash its full potential it is necessary to understand its fundamental principles and building blocks. Therefore we strongly recommend to attend our 3 day VNA Tools training course first. Further parts of the training workshop cover theoretical and metrological concepts and best measurement practice (see attached course flyers).