METAS S-Parameter Metrology

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Welcome to the METAS S-Parameter Metrology forum!

Scattering parameters are fundamental quantities in radio frequency and microwave metrology. Traceability to SI units for these measurements is established with the help of calculable standards. Progress has been made over the last years in characterizing these standards. Major steps forward were achieved with advanced modelling of the entire standard, including connector interface and with the use of multivariate uncertainty evaluation, taking correlations fully into account. The improvements have led to more consistent and more accurate measurements.

The goal of this forum is to make Vector Network Analyzer (VNA) users aware about the new findings in VNA metrology, to provide good measurement practice and how this is linked with our S-Parameter calibration services.

Other interesting VNA metrology links:

METAS VNA Tools II is a software designed to compute uncertainties of S-parameter measurements, see www.metas.ch/vnatools

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METAS S-Parameter Metrology

5/26/20

Reference_40:Mastering the coaxial 1.0 mm connector interface

[40] M. Zeier. Mastering the coaxial 1.0 mm connector interface. METinfo Vol 23, No. 2/2016

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Reference_40:Mastering the coaxial 1.0 mm connector interface

[40] M. Zeier. Mastering the coaxial 1.0 mm connector interface. METinfo Vol 23, No. 2/2016

5/26/20

METAS S-Parameter Metrology

5/26/20

Reference_39: Best Measurement Practice in VNA Measurements

[39] J. Ruefenacht. Best Measurement Practice in VNA Measurements. VNA Tools seminar. 28.10.2014

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Reference_39: Best Measurement Practice in VNA Measurements

[39] J. Ruefenacht. Best Measurement Practice in VNA Measurements. VNA Tools seminar. 28.10.2014

5/26/20

METAS S-Parameter Metrology

5/26/20

Reference_38: 3.5 mm Primary VNA calibration experiment

[38] J. Ruefenacht, J. Hoffmann. 3.5 mm Primary VNA calibration experiment. EURAMET TC-EM SC-

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Reference_38: 3.5 mm Primary VNA calibration experiment

[38] J. Ruefenacht, J. Hoffmann. 3.5 mm Primary VNA calibration experiment. EURAMET TC-EM SC-

5/26/20

METAS S-Parameter Metrology

5/26/20

Reference_37: The Curious Mating Habits of Coaxial Connectors

[37] J. Hoffmann, J. Ruefenacht. The Curious Mating Habits of Coaxial Connectors. METinfo Vol. 17, No

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Reference_37: The Curious Mating Habits of Coaxial Connectors

[37] J. Hoffmann, J. Ruefenacht. The Curious Mating Habits of Coaxial Connectors. METinfo Vol. 17, No

5/26/20

METAS S-Parameter Metrology

5/26/20

Reference_36: 2.4 mm slotless connector investigations

[36] J. Ruefenacht, J. Hoffmann. 2.4 mm slotless connector investigations. European Metrology

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Reference_36: 2.4 mm slotless connector investigations

[36] J. Ruefenacht, J. Hoffmann. 2.4 mm slotless connector investigations. European Metrology

5/26/20

METAS S-Parameter Metrology

5/26/20

Reference_35: Pin diameter specifications and challenges

[35] J. Ruefenacht. Pin diameter specifications and challenges. European Metrology Workshop (Keysight

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Reference_35: Pin diameter specifications and challenges

[35] J. Ruefenacht. Pin diameter specifications and challenges. European Metrology Workshop (Keysight

5/26/20

METAS S-Parameter Metrology

5/26/20

Reference_34: Pin gap aspects in metrological practice

[34] J. Ruefenacht. Pin gap aspects in metrological practice. European Metrology Workshop (Keysight),

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Reference_34: Pin gap aspects in metrological practice

[34] J. Ruefenacht. Pin gap aspects in metrological practice. European Metrology Workshop (Keysight),

5/26/20

Juerg Ruefenacht3

5/26/20

Connector effects on S-Parameters (papers and presentations)

the related presentation can be found under Reference_33: https://groups.google.com/d/msg/s-parameter

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Connector effects on S-Parameters (papers and presentations)

the related presentation can be found under Reference_33: https://groups.google.com/d/msg/s-parameter

5/26/20

METAS S-Parameter Metrology

5/26/20

Reference_33: S-parameter traceability including the systematic connector effects

[33] J. Ruefenacht, J. Hoffmann. S-parameter traceability including the systematic connector effects.

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Reference_33: S-parameter traceability including the systematic connector effects

[33] J. Ruefenacht, J. Hoffmann. S-parameter traceability including the systematic connector effects.

5/26/20

METAS S-Parameter Metrology

5/26/20

Reference_32: Practical hints: Splitter Characterization

[32] M. Wollensack, J. Hoffmann, J. Ruefenacht, M. Zeier. Practical hints: Splitter Characterization.

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Reference_32: Practical hints: Splitter Characterization

[32] M. Wollensack, J. Hoffmann, J. Ruefenacht, M. Zeier. Practical hints: Splitter Characterization.

5/26/20

METAS S-Parameter Metrology

5/26/20

Reference_31: VNA Tools: Splitter Characterization

[31] M. Wollensack, J. Hoffmann, J. Ruefenacht, M. Zeier. VNA Tools: Splitter Characterization. 4 th

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Reference_31: VNA Tools: Splitter Characterization

[31] M. Wollensack, J. Hoffmann, J. Ruefenacht, M. Zeier. VNA Tools: Splitter Characterization. 4 th

5/26/20

METAS S-Parameter Metrology

5/26/20

Reference_30: VNA Tools – new powerful S-Parameter CMC functionality

[30] J. Ruefenacht, M. Wollensack, M. Zeier. VNA Tools – new powerful S-Parameter CMC functionality.

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Reference_30: VNA Tools – new powerful S-Parameter CMC functionality

[30] J. Ruefenacht, M. Wollensack, M. Zeier. VNA Tools – new powerful S-Parameter CMC functionality.

5/26/20

METAS S-Parameter Metrology

5/26/20

Reference_29: S-Parameter traceability up to 110 GHz – practical aspects

[29] J. Ruefenacht, M. Wollensack, J. Hoffmann, D. Stalder, M. Zeier. S-Parameter traceability up to

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Reference_29: S-Parameter traceability up to 110 GHz – practical aspects

[29] J. Ruefenacht, M. Wollensack, J. Hoffmann, D. Stalder, M. Zeier. S-Parameter traceability up to

5/26/20

METAS S-Parameter Metrology

5/25/20

on-wafer measurements using VNA Tools

A presentation about the use of VNA Tools with on-wafer measurements can be found here: https://

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on-wafer measurements using VNA Tools

A presentation about the use of VNA Tools with on-wafer measurements can be found here: https://

5/25/20

METAS S-Parameter Metrology

5/25/20

Reference_28: On-wafer measurements using VNA Tools

[28] M. Wollensack. On-wafer measurements using VNA Tools. PlanarCal training day, 14.12.2017

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Reference_28: On-wafer measurements using VNA Tools

[28] M. Wollensack. On-wafer measurements using VNA Tools. PlanarCal training day, 14.12.2017

5/25/20

METAS S-Parameter Metrology2

5/25/20

Characterization of non-insertable adapters or adapters equipped with different connector families on both sides

See also Reference_27 https://groups.google.com/d/msg/s-parameter-metrology/waw3g8GggY8/u1aWdxwjBwAJ

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Characterization of non-insertable adapters or adapters equipped with different connector families on both sides

See also Reference_27 https://groups.google.com/d/msg/s-parameter-metrology/waw3g8GggY8/u1aWdxwjBwAJ

5/25/20

METAS S-Parameter Metrology

5/25/20

Reference_27: Adapter characterization up to 110 GHz

[27] J. Ruefenacht. Adapter characterization up to 110 GHz. 6 th European ANAMET meeting, 28.06.2016

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Reference_27: Adapter characterization up to 110 GHz

[27] J. Ruefenacht. Adapter characterization up to 110 GHz. 6 th European ANAMET meeting, 28.06.2016

5/25/20

METAS S-Parameter Metrology

5/25/20

Reference_26: S-Parameter Definition for Adapters with a Dielectrically Loaded Connector

[26] J. Hoffmann, P. Huerlimann, M. Wollensack, J. Ruefenacht, M. Zeier. S-Parameter Definition for

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Reference_26: S-Parameter Definition for Adapters with a Dielectrically Loaded Connector

[26] J. Hoffmann, P. Huerlimann, M. Wollensack, J. Ruefenacht, M. Zeier. S-Parameter Definition for

5/25/20

METAS S-Parameter Metrology

5/25/20

Reference_25: Improve mm-Wave Measurement Repeatability and Accuracy by Increasing Coaxial Connector Pin Gap

[25] Ken Wong, Johannes Hoffmann. Improve mm-Wave Measurement Repeatability and Accuracy by

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Reference_25: Improve mm-Wave Measurement Repeatability and Accuracy by Increasing Coaxial Connector Pin Gap

[25] Ken Wong, Johannes Hoffmann. Improve mm-Wave Measurement Repeatability and Accuracy by

5/25/20

METAS S-Parameter Metrology

5/25/20

Reference_24: VNA Tools II: Calibrations Involving Eigenvalue Problems

[24] M. Wollensack, J. Hoffmann, D. Stalder, J. Ruefenacht, M. Zeier. VNA Tools II: Calibrations

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Reference_24: VNA Tools II: Calibrations Involving Eigenvalue Problems

[24] M. Wollensack, J. Hoffmann, D. Stalder, J. Ruefenacht, M. Zeier. VNA Tools II: Calibrations

5/25/20

METAS S-Parameter Metrology

5/25/20

Reference_23: Contemporary evaluation of measurement uncertainties in vector network analysis

[23] M. Zeier, J. Hoffmann, J. Ruefenacht, M. Wollensack. Contemporary evaluation of measurement

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Reference_23: Contemporary evaluation of measurement uncertainties in vector network analysis

[23] M. Zeier, J. Hoffmann, J. Ruefenacht, M. Wollensack. Contemporary evaluation of measurement

5/25/20

METAS S-Parameter Metrology

5/1/20

Reference_22: Effects of Connectors and Improper Mounting of Air Lines in TRL Calibration

[22] F. Mubarak, J. Hoffmann. Effects of Connectors and Improper Mounting of Air Lines in TRL

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Reference_22: Effects of Connectors and Improper Mounting of Air Lines in TRL Calibration

[22] F. Mubarak, J. Hoffmann. Effects of Connectors and Improper Mounting of Air Lines in TRL

5/1/20

METAS S-Parameter Metrology

5/1/20

Reference_21: Considerations for Using Waveguide Extenders

[21] J. Hoffmann, D. Stalder, M. Wollensack, J. Ruefenacht, M. Zeier. Considerations for Using

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Reference_21: Considerations for Using Waveguide Extenders

[21] J. Hoffmann, D. Stalder, M. Wollensack, J. Ruefenacht, M. Zeier. Considerations for Using

5/1/20

METAS S-Parameter Metrology

5/1/20

Reference_20: Temperature Control of Waveguide Extenders

[20] J. Hoffmann, D. Stalder, M. Wollensack, J. Ruefenacht, M. Zeier. Temperature Control of

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Reference_20: Temperature Control of Waveguide Extenders

[20] J. Hoffmann, D. Stalder, M. Wollensack, J. Ruefenacht, M. Zeier. Temperature Control of

5/1/20

METAS S-Parameter Metrology

5/1/20

Reference_19: Mechanical Aspects in mm-wave Measurements

[19] M. Zeier, J. Hoffmann, J. Ruefenacht, D. Stalder, M. Wollensack. Mechanical Aspects in mm-wave

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Reference_19: Mechanical Aspects in mm-wave Measurements

[19] M. Zeier, J. Hoffmann, J. Ruefenacht, D. Stalder, M. Wollensack. Mechanical Aspects in mm-wave

5/1/20

METAS S-Parameter Metrology

5/1/20

Reference_18: Traceable calibration with 1.0mm coaxial standards

[18] J. Hoffmann, M. Wollensack, J. Ruefenacht, D. Stalder, M. Zeier. Traceable calibration with 1.0

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Reference_18: Traceable calibration with 1.0mm coaxial standards

[18] J. Hoffmann, M. Wollensack, J. Ruefenacht, D. Stalder, M. Zeier. Traceable calibration with 1.0

5/1/20

METAS S-Parameter Metrology

5/1/20

Reference_17: Comparison of Methods for Measurement of Equivalent Source Match

[17] J. Hoffmann, M. Wollensack, J. Ruefenacht, M. Zeier. Comparison of Methods for Measurement of

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Reference_17: Comparison of Methods for Measurement of Equivalent Source Match

[17] J. Hoffmann, M. Wollensack, J. Ruefenacht, M. Zeier. Comparison of Methods for Measurement of

5/1/20

METAS S-Parameter Metrology

5/1/20

Reference_16: Extended S-parameters for imperfect test ports

[16] J. Hoffmann, M. Wollensack, J. Ruefenacht, M. Zeier. Extended S-parameters for imperfect test

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Reference_16: Extended S-parameters for imperfect test ports

[16] J. Hoffmann, M. Wollensack, J. Ruefenacht, M. Zeier. Extended S-parameters for imperfect test

5/1/20

METAS S-Parameter Metrology

5/1/20

Reference_15: The Propagation Constant of Coaxial Offset Shorts with Rough Surfaces

[15] J. Hoffmann, J. Ruefenacht, M. Zeier. The Propagation Constant of Coaxial Offset Shorts with

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Reference_15: The Propagation Constant of Coaxial Offset Shorts with Rough Surfaces

[15] J. Hoffmann, J. Ruefenacht, M. Zeier. The Propagation Constant of Coaxial Offset Shorts with

5/1/20

METAS S-Parameter Metrology

5/1/20

Reference_14: Stability tests of electronic calibration units

[14] M. Zeier, J Hoffmann, P. Huerlimann, J. Ruefenacht, M. Wollensack, R. Judaschke, K. Kuhlmann.

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Reference_14: Stability tests of electronic calibration units

[14] M. Zeier, J Hoffmann, P. Huerlimann, J. Ruefenacht, M. Wollensack, R. Judaschke, K. Kuhlmann.

5/1/20

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