Google Groups no longer supports new Usenet posts or subscriptions. Historical content remains viewable.
Dismiss
NanoVNA : Three papers on ResearchGate regarding the calibration technique of NanoVNA
10 views
Skip to first unread message
gin-pez arg
Feb 4, 2022, 4:30:17 AM2/4/22
to
NanoVNA : Three papers on ResearchGate regarding the calibration technique of NanoVNA
Hello.
It may be of some interest to you that NanoVNA uses the calibration
technique which is the subject of the following three papers by us now
available on ResearchGate.
Sincerely,
73
Nikolitsa, OE3ZGN|SV7DMC
Petros, OE3ZZP|SV7BAX
- - - - -
1/3
Building Complex Differential Error Regions
October 2008
Conference: ANAMET Meeting 30 At: NPL National Physical Laboratory,
Teddington, UK Volume: Session III, Measurement uncertainty and
traceability
Abstract
It is impossible to analytically estimate real uncertainties directly
from complex differential errors - Real rectangular uncertainties are
estimated from the orthogonal circumscribed about the complex DER -
Real polar uncertainties are estimated from the annular sector
circumscribed about the complex DER - The proposed method of
uncertainty estimation, by building complex DERs, can be applied to
any VNA calibration technique.
https://www.researchgate.net/publication/230625680_Building_Complex_Differential_Error_Regions
2/3
Complex DERs in Non-Zero Length Thru VNA Measurements
October 2009
Conference: ANAMET Meeting 32, At: National Physical Laboratory NPL,
Teddington, UK Volume: Session III
Abstract
After "Building Complex Differential Error Regions" for two-port
calibration VNA measurements, in 30th ANAMET meeting, we are
considering now the case of Non-Zero Length Thru or indirect Thru with
SLOT calibration for either case of same type/sex connectors or
different type connectors, on both ports.
https://www.researchgate.net/publication/230625718_Complex_DERs_in_Non-Zero_Length_Thru_VNA_Measurements
3/3
Measurement Uncertainty in Network Analyzers: Differential Error
Analysis of Error Models Part 4: Non-Zero Length Through in Full
Two-Port SLOT Calibration
September 2016
Journal: FunkTechnikPlus # Journal, Issue: 11, Year: 4, Pages: V1-7 to V1-29
The most accurate full two-port calibration of a VNA Vector Network
Analyzer requires a Direct or Zero–Length Through connection. However,
it is not uncommon at all to have one or two cables and a DUT Device
Under Test with incompatible connectors, either of different type or
of the same type/sex, which enforce then the use of some kind of
barrel or adapter. Thus, in this paper, we study these cases of
Indirect or Non-Zero Length Through, we estimate the effects of such
connections on the measurement uncertainty by using our theory of
Differential Error Regions and Intervals DERs/DEIs, and we evaluate
our resulting method by applying it in practice to a built two–port
network, which was measured against frequency with a SLOT calibrated
VNA extended by two lengthy cables.
https://www.researchgate.net/publication/358164808_Measurement_Uncertainty_in_Network_Analyzers_Differential_Error_Analysis_of_Error_Models_Part_4_Non-Zero_Length_Through_in_Full_Two-Port_SLOT_Calibration
Hello.
It may be of some interest to you that NanoVNA uses the calibration
technique which is the subject of the following three papers by us now
available on ResearchGate.
Sincerely,
73
Nikolitsa, OE3ZGN|SV7DMC
Petros, OE3ZZP|SV7BAX
- - - - -
1/3
Building Complex Differential Error Regions
October 2008
Conference: ANAMET Meeting 30 At: NPL National Physical Laboratory,
Teddington, UK Volume: Session III, Measurement uncertainty and
traceability
Abstract
It is impossible to analytically estimate real uncertainties directly
from complex differential errors - Real rectangular uncertainties are
estimated from the orthogonal circumscribed about the complex DER -
Real polar uncertainties are estimated from the annular sector
circumscribed about the complex DER - The proposed method of
uncertainty estimation, by building complex DERs, can be applied to
any VNA calibration technique.
https://www.researchgate.net/publication/230625680_Building_Complex_Differential_Error_Regions
2/3
Complex DERs in Non-Zero Length Thru VNA Measurements
October 2009
Conference: ANAMET Meeting 32, At: National Physical Laboratory NPL,
Teddington, UK Volume: Session III
Abstract
After "Building Complex Differential Error Regions" for two-port
calibration VNA measurements, in 30th ANAMET meeting, we are
considering now the case of Non-Zero Length Thru or indirect Thru with
SLOT calibration for either case of same type/sex connectors or
different type connectors, on both ports.
https://www.researchgate.net/publication/230625718_Complex_DERs_in_Non-Zero_Length_Thru_VNA_Measurements
3/3
Measurement Uncertainty in Network Analyzers: Differential Error
Analysis of Error Models Part 4: Non-Zero Length Through in Full
Two-Port SLOT Calibration
September 2016
Journal: FunkTechnikPlus # Journal, Issue: 11, Year: 4, Pages: V1-7 to V1-29
The most accurate full two-port calibration of a VNA Vector Network
Analyzer requires a Direct or Zero–Length Through connection. However,
it is not uncommon at all to have one or two cables and a DUT Device
Under Test with incompatible connectors, either of different type or
of the same type/sex, which enforce then the use of some kind of
barrel or adapter. Thus, in this paper, we study these cases of
Indirect or Non-Zero Length Through, we estimate the effects of such
connections on the measurement uncertainty by using our theory of
Differential Error Regions and Intervals DERs/DEIs, and we evaluate
our resulting method by applying it in practice to a built two–port
network, which was measured against frequency with a SLOT calibrated
VNA extended by two lengthy cables.
https://www.researchgate.net/publication/358164808_Measurement_Uncertainty_in_Network_Analyzers_Differential_Error_Analysis_of_Error_Models_Part_4_Non-Zero_Length_Through_in_Full_Two-Port_SLOT_Calibration
0 new messages