Dear Tara Mishra,
Hello.
A STEM image is acquired by scanning a converged probe on the object. In order to image atomic columns (similar to the crystal you have used), the probe has to be positioned close to or at the centre of the atomic column. In your crystal, there are 13 atomic columns. A simulated STEM image with the current set of probe parameters decreases the intensity of some of the atomic columns. Now consider the grid of probes that you have used, it is 10x10. The probe grid starts from the top left corner and each cross-hair position represents a probe position. Notice that there are actually 121 probe positions (11x11) although 10x10 probe grid was specified. The right-most column and bottom-most row are there just to complete the scanning area and are not visited during STEM image formation.
Due to the smaller grid sampling (10x10), some of the atomic columns do not get the probe to be close to the centre of those columns. The intensity of such columns would be diminished depending on how close a probe is to the centre of the column. Please go through the attached tutorial by M. Sarahan (available on Prof. Koch's site:
https://www.physics.hu-berlin.de/en/sem/software/qstem-documentation) for guidelines on how to assign the scanning window parameters. Increasing the grid sampling such that each atomic column is visited at least once should solve the current issue, say, 20x20.
Regards,
Manoj Settem