Labview Jitter Analysis Toolkit Download
Laveta Nachman
The Jitter Analysis Toolkit provides a library of VIs optimized for performing high-throughput, automated jitter, eye diagram, and phase-noise measurements. The toolkit is hardware-independent and can be used with NI high-speed and high-resolution digitizers as well as third-party oscilloscopes and digitizers.
Dolman explained that the toolkit includes color-graded persistence eye diagrams, mask limit testing, and bathtub plots. Other types of plots such as histograms, trend, and spectrum already are provided by LabVIEW. The toolkit also has a signal generator function that facilitates creation of a test signal with user-defined jitter characteristics.
In an effort to extend the information available from signal integrity analysis, several companies offer tools that estmate eye variations in two directions: conventionally with respect to time as well as vertically. Amplitude noise can be separated into its constituent parts in the same way as timing jitter. The capability to do so can help to identify the root cause(s) leading to a high BER.
There is no shortage of jitter and noise analysis tools. The challenge is not whether you can accomplish a certain measurement or subsequent analysis but rather to be clear about what you actually need to do. Direct-sampling scopes impose the least restrictions on the signal. However, they do not offer the same level of jitter decomposition performance as a sampling scope. Neither is their estimate of total jitter equivalent to that provided by a BERT. In addition, a BERT identifies the data transitions associated with observed errors.
Characterize jitter on GHz clocks and serial buses with ease. Bring statistics into your everyday toolkit with integrated measurements. Use the same simple drag and drop action to add advanced and everyday measurements.
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