Fwd: RF Wafer Probing Fundamentals Webinar - July 30

[Fabricio Alcalde]

FYI

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De: Adriana Pontini | Raien Argentina <apon...@raien.com.ar>
Date: mar., 21 de jul. de 2020 a la(s) 17:18
Subject: RV: RF Wafer Probing Fundamentals Webinar - July 30
To: <apon...@raien.com.ar>

 

RF Wafer Probing Fundamentals Webinar   Please register for the upcoming Webinar entitled “RF Wafer Probing Fundamentals”, hosted by FormFactor’s Jason Alikpala, Senior Applications Engineer, on Thursday, July 30th.   Click here to register – July 30th, 10:00am PST / 1:00pm EST     Who should attend: Persons with an understanding of RF and an interest in RF wafer probing and calibration.     In this seminar, you will learn the following: Introduction to on-wafer probing What is an RF probe How to choose the right probe On-wafer calibration S-parameter basics Overview of calibration methods How to calibrate Introduction to WinCal XE calibration software On-wafer measurement verification How good is my calibration? Additional considerations Design for testability De-embedding Temperature testing with RF probes Probe cleaning Open technical discussion

 

 

Por cualquier pregunta por favor contactar a

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Dra. Adriana E. Pontini | Directora Comercial | Raien Argentina S.A.
Tel.:+54 (11) 4701.9316 Int. 110| Cel.: +54 9 (11) 4179.1326
Email: apon...@raien.com.ar | www.raien.com.ar 
Congreso 2171 Piso 6º | (C1428BVE) Ciudad Autónoma de Buenos Aires | Argentina 

 

 

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