Hardware guru bunnie Huang talks about the open-source tools he uses to design circuits, and why he wants to build his own ASIC. → Read more
Webinar: Overcome Critical Power Consumption Testing Challenges Learn to improve the accuracy of your test results, since missing a small design flaw in analyzing power consumption can quickly escalate into bigger issues along the development cycle.
Engineers make the fins of 14-nanometer FinFETs acoustically resonate to forge the building block of 5G oscillators, filters, and processor clocks → Read more
Speedy silicon photodiodes are one of the missing ingredients to silicon photonics systems → Read more
Portable Devices Bring New Versatility to Dewpoint Measurement These portable devices — plus Kahn’s range of quality stationary hygrometers — combat moisture and improve efficiency.
The gallium-nitride HEMT-LED lets voltage control light, replacing typical LED support circuitry → Read more
A thin film of a topological insulator could make sci-fi technology a reality → Read more
As the semiconductor industry strives to meet performance, size, and cost demands, learn how automated test strategies must evolve to keep pace.
This whitepaper describes a flexible, cost-effective, stand-alone solution that prevents the loss of critical data.
Exemplary performance from your test assets ensures the best performance for your device under test.
Scientists electrically detect magnetic swirls called skyrmions for the first time → Read more
Low-voltage circuit extends battery life by 50 percent → Read more
Interested in other IEEE Newsletters? SIGN UP HERE PRIVACY POLICY
This email was sent by IEEE | 3 Park Avenue New York, NY 10016 USA |
©2018 IEEE - All rights reserved. Use of this Web site signifies your agreement to the terms and conditions.
