Ni Digital Pattern Editor Download
Heli Whetzel
I need to run a digital test at low speed, but I do not find a good way to do it using the Digital Pattern Editor. Previously I used the Digital Waveform Editor and there was a tool, Resample Waveform, which allowed to expand a waveform. That could be a way to get around the problem. But I also do not find that possibility in the Digital Pattern Editor.
There should not be any limits on how slow you can run a digital test. Have you tried looking at the Specification.specs tab and specifying a lower frequency for the period? Also under the timing tab you can specify a formula as to the frequency you want to output your data at as a function of the period. For an example of how to implement this, please navigate to Help>>Getting Started Example and have a look at the example called SPI Example.
Looking at the spec sheet for the PXIe-6570, it seems that this is some hardware limit. The vector period range is specified as 10 ns to 40 us, so it can not run slower than 25 kHz. What I am doing at the moment is to use a repeat(25) Opcode for each vector in the pattern to reduce the speed to 1 kHz. But it does not look like the ideal solution.
I have a PXIE digital pattern instrument which I'd like to be able to load with patterns during LabVIEW VI program execution (my program has a feedback loop which determines the next pattern based on current results, etc.) I have looked at the "Load Pattern" VI but it only accepts an input file of a specific format. I know that the digital pattern editor creates patterns that the VI can use but it cannot be used to make patterns that are edited during run-time.
What is the best approach to creating new patterns as LabVIEW is running? Do I need to open a pattern file in plain text editor, fill it with my pattern and then load the file into the "Load Pattern" VI every time? Or is there a faster/more elegant way of doing this?
On a related note, how does one make a pattern file in plain text? I tried to open one of the example .digipat files in a text editor but the file came out looking like garbage (bunch of non-ascii characters, etc.)
There are two basic approaches to accomplishing the goal of doing digital pattern operations determined at run-time/in the middle of test execution. The first is as you're describing, programmatically generating pattern files. The compiled .digipat files have a raw ASCII format, .digipatsrc, talked about in the help here:
It's pretty similar to other ATE pattern formats, if you're familiar. You would have to do text editing to generate these files, and before you can load them onto hardware they have to be compiled to the binary .digipat format. That happens automatically if you load them into the Digital Pattern Editor, but you can do it programmatically with an included executable: -XX/help/375145b/digipat/compiling-patterns/. Fun fact, that same program can be used to de-compile from patterns to text file. So the workflow would be, generate/edit text files, compile into .digipat, load them onto device, burst.
All that said, depending on what you need to generate, it's possible you can just use the source/capture waveform functionality. That's the more elegant way to do I/O determined during test execution. You'd include some opcodes in your patterns to load capture and source waveforms, then call the source/capture opcodes to actually generate or read in data. For generating, you can write source waveforms very simply with the API in application memory, and for reading in you query the capture memory after the fact to see what you read in. There are examples that show off source/capture, and here's some help doc:
But that is just part of our problem: we are not digital test engineers, we are a small crew of RF/microwave test engineers, and we need to get ourselves educated very quickly on how to master these new PXIe-6570 Digital Pattern Instruments. I chose your forum-post to place this request into, because you made the comment "It's pretty similar to other ATE pattern formats, if you're familiar."
Well, what if a test engineer is not familiar with these formats, nor the terminology (Shmoo plot?). We have come to the realization that the relationship between pins, pin-groups, channels, levels, timing, etc seem to be abstract and variable, and we are looking for resources that will drive our understanding towards mastering these instuments. So my request is simple: besides the documentation and examples that ship with the NI-Digital driver package (currently at v18.0.0), what would you recommend as resources (textbooks, training-materials, industry white-papers, anything...!) that could lead a talented and motivated crew of test engineers by the hand into the world of "ATE pattern formats" and beyond. My guess is that any replies you could offer would go a long way to helping your "non-digital-test-engineer" customers, of which I would suppose there are many. Thank you if you can help us. JB
Resurrecting an old thread, I need to generate the digital pattern at runtime. I have managed to get the source waveform feature as expected, and can programatically do it from LabVIEW and it all works, I can generate the source waveform at runtime.
Hi, I'm just starting the process of learning pattern drafting and I'd really like to do it digitally. I'm a regular user of digital art programs and a semi-regular user of CAD programs so I'm not super worried about the learning curve of a new program. However I'm not confident in my ability to know which features are actually useful for pattern drafting. I will pretty much only be making clothes for myself and maybe occasionally friends so I'm not sure concerned about grading. I've mostly been looking at clo3d and seamly3d/Me. I like the idea of being able to view an estimate of what the pattern will look like in clo3d, but am a little unclear on if the program is actually useful for drafting. Seamly seems more straightforward, but maybe better for more experienced drafters? I also have heard valentina is better than Seamly, but it hasn't been updated in a while. tl;dr, whats the best digital drafting program and what features do you find actually helpful.
The PXI Digital Pattern Instrument brings ATE-class digital to the PXI platform through features and programming that are familiar to semiconductor test engineers. Those features not only come through in the hardware of the instrument, they also appear in the NI-Digital Pattern Driver and Digital Pattern Editor. The digital pattern instrument represents an improved experience to previously existing NI PXI Digital Waveform Instruments, which use the NI-HSDIO device driver. PXI Digital Waveform Instruments do not have this familiar programming method for semiconductor test. For existing customers using PXI Digital Waveform Instruments, particularly the PXIe-6556 or PXIe-6555 (24 channels with per-pin PPMU), there are several considerations when migrating test programs to the PXIe-6570 digital pattern instrument.
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Follow along with our tutorials and learn digital pattern making in Adobe Illustrator CC. Purchase and download one of our editable digital basic blocks. We have a few options for you to choose from...
Thanks for your comment. Unfortunately, our PDF patterns are not editable, therefore, you will not be able to change the logo. However, if you purchase an SVG (editable) pattern you can open it in Adobe Illustrator and then replace the logo with your own. Please note, you may not place your logo on one of our patterns without first adjusting or changing the design of that pattern. We have a whole series of Pattern making tutorials in Adobe illustrator that allow you to adapt our basic blocks into custom sewing patterns or designs. Please read our Terms & Conditions for more information.
Hello!
I love your tutorials so much and I am super excited to try making garments using these slopers as my base!! I did have one question. When printed, there is a white edge, which I understand is inevitable. When I buy PDF patterns, there is often a border in each page that allows me to line up the lines when I tape my pages together. Do you know if there is a way we can add that?