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Penélope Lichlyter
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Not only does Metrolog X4 architecture benefit from current computer and OS technologies significantly increasing the performances and metrology software throughput, but it also simplifies your day-to-day measurement workflow.
Hello there r/metrology! Me and my team are in need of your expertise. We are currently considering switching our software from Wenzel's Quartis to Metrologic Group's Metrolog X4 or Polyworks. As far as the software I've used before- I remember Zeiss Calypso and Caligo fondly, but those are not available for the setup in the current plant. Quartis has paled in comparison to the Zeiss software especially when it comes to stability. We are considering using contact measurements and a Kreon Zephyr III (also available as a Wenzel/polyworks combo) blue laser scanning head. Do you have any experience with this software/hardware and any advice to share?
With the arrival of desktop computing and Windows operating systems in the early eighties, the company introduced the first ever Windows based 3D measuring software, known as Metrolog. Little could they have known at that moment in time the impact this innovation would have on the 3D inspection market. The company now has an annual turnover of around 40 million with offices and resellers located throughout the World, and thousands of licences of the latest Metrolog X4 software in daily use throughout all major manufacturing industries. In 2018, Metrologic Group was acquired by Sandvik Group for over 300m, a record acquisition within the metrology sector, bearing in mind that Metrologic Group is predominantly a software company.
When it comes to device interfaces, the philosophy has again completely changed. Unlike a CMM, which is acquired and used typically for 20 years or more, organisations are now investing in and upgrading to the latest portable metrology on a regular basis. So, when a customer decides to acquire Metrolog X4 for use with a portable device, EVERY portable device interface is supplied as standard. If the device is exchanged or upgraded, the software can continue to operate with the new device at no additional cost. In addition, all functionalities commonly associated with such devices are included, such as bundle adjustments, build/inspect, leapfrog, etc. This is fine if the user intends to use the software with multiple devices, but Metrologic have also considered those who may only want the software for one device. In this case, the user may select a single device e.g. a Creaform HandySCAN, and the price of the software is reduced significantly to reflect the limitation imposed.
Metrolog X4 is to the measurement and metrology industry what Google is to internet browsing. Users want one software that can deal with any application, work with any type of measuring device, provide results in a format that is easy to understand, and to do it all without any fuss and bother. The latest Metrolog X4 software provides users with a fully customisable user interface that can work with any type of measuring device. The legacy of Metrolog as CMM software is unrivalled, having started out as CMM software over 30 years ago. Other software systems having come and gone, but Metrolog X4 is still the only software that is able to interface directly to almost every CNC or manual CMM controller that is still in use today, irrespective of the age of the CMM.
To meet needs of users who internalize metrology, JRI has developed an easy and quick method to calibrate the LoRa SPY long-range connected sensors and Nano SPY mini temperature dataloggers. The process allows also to:
The new Metrolog X4 platform not only provides new computerized architecture and advanced technology as in the current systems (Windows 64-bit and multiprocessor PC), thus considerably increasing the performance and throughput of your metrology software, but additionally aims at simplifying your day-to-day measurement operations.
Metrologic Group has announced the availability of the latest versions of its metrology software products Metrolog X4 & Silma X4 to keep addressing the evolving challenges of 3D metrology of customers.
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