Fw: MIMOS : UPCOMING SEMINARS AND TRAININGS HIGHLIGHTS
che...@gmail.com
| From: Letchumy Ramasamy <letc...@mimos.my> Sent: Friday, 13 February 2015 18:53 To: Letchumy Ramasamy Cc: Thiagesh Kanagalingam; Bazura Abdul Rahim; Soon Yew Hee; Mohd Radzuan Tumiran; Wan Azli Wan Ismail; Norliza Said; Nasimah Saaidin; Agust Salim Mohamed Noor Subject: MIMOS : UPCOMING SEMINARS AND TRAININGS HIGHLIGHTS |
MARCH 2015 - COURSE HIGHLIGHTS
X-Ray Photoelectron Spectroscopy (XPS)
10 March 2015 (Tuesday) : 9.00am – 5.00pm @ MIMOS Berhad, KL
XPS: X-Ray Photoelectron Spectroscopy
ESCA: Electron Spectroscopy for Chemical Analysis
XPS, also known as ESCA, is the most widely used surface analysis technique because of its relative simplicity in use and data interpretation.
The sample is irradiated with mono-energetic x-rays causing photoelectrons to be emitted from the sample surface.
An electron energy analyzer determines the binding energy of the photoelectrons. From the binding energy and intensity of a photoelectron peak,
the elemental identity, chemical state, and quantity of an element are determined. The information XPS provides about surface layers or thin film
structures is of value in many industrial applications including: polymer surface modification, catalysis, corrosion, adhesion, semiconductor
and dielectric materials, electronics packaging, magnetic media, and thin film coatings used in a number of industries.
Electron Energy Loss Spectroscopy (EELS)
24 March 2015 (Tuesday): 9.00am - 5.00pm @MIMOS BERHAD, KL.
EELS is the analysis of the energy distribution of the electrons that have passed through a thin sample and interacted with it inelastically.
EELS is a very powerful technique capable of providing both compositional and chemical information from sub-nanometer areas in the sample.
Due to the large interaction cross-sections and narrow angular distribution of the scattered electrons, EELS is very sensitive and highly localized.
Core level EELS is sensitive to all elements in the periodic table (with the exception of atomic hydrogen) but is particularly sensitive to light elements.
The ability of EELS to probe the local density of states makes it uniquely suited to measuring changes is local bonding at near atomic resolution.
Material Analysis Training : Surface Analysis Techniques
23 – 25 March 2015 (Monday – Wednesday): 9.00am – 5.00pm @MIMOS Berhad, KL
The characteristics of surface and near-surface regions of materials can be characterised by various surface analysis techniques.
The applications of many engineering materials are determined by surface and near-surface structures. Therefore, the well-being of this region is essential
in order to obtain pre-required conditions for materials to be applied for specific applications. Typically, the failure of engineering products
can be traced back to surface/near-surface contamination or surface reconstruction. In order to obtain more information related to the failure,
insights of these regions are required. This course introduces the basic principles of surface science, which serves as an essential foundation to explain
the operation concepts and applications of several important surface analysis techniques. This easy-to-follow and easy-to-understand training course also
elaborates on the know-how of interpreting analysis data. Also covered are brief fundamental theories and skills in selecting relevant techniques with respect
to practical engineering usage. The ultimate goal of this course is to increase level of knowledge in making a correct technical decision to solve surface-related
issues and transform knowledge into application.
Six Sigma White Belt Training
23 March 2015 (Monday) : 9.00am – 5.00pm @ MIMOS Berhad, KL
Business operations in manufacturing or service sectors exist in an environment of increasing challenge. These key challenges are rising raw material and labour
cost as well as customers’ demands to produce high quality products and services at a faster pace and lower cost to name a few. These key challenges drive
the needs for organisations to seek operational improvement. Six Sigma is a proven methodology to achieve significantly better results in customer satisfaction
and profit growth by utilising various statistical tools for effective solutions. The results are revenue improvement, reduction in cost and cycle time, increased
customer satisfaction and other performance-related improvements critical to the company. In addition, the implementation of Six Sigma will engage and encourage
employees to contribute in problem solving in work routine.
APRIL & MAY 2015 - COURSE
· Gas Chromatography-Mass Spectroscopy (GC-MS) Workshop
15 – 16 April 2015 (Wednesday – Thursday): 9.00 – 5.00pm @ MIMOS Berhad, KL
· Spectroscopy Week (ICP-MS, FT-IR Imaging & UV-Vis-NIR) Workshop
20 – 23 April 2015 ( Monday – Thursday): 9.00 – 5.00pm @ MIMOS Berhad, KL
· Device Theory and Wafer Fabrication Technology Training
12 – 13 May 2015 (Tuesday – Wednesday): 9.00 – 5.00pm @ MIMOS Berhad, KL
· Non-destructive & Electrical Failure Analysis Techniques & Tools Training
26 – 27 May 2015 (Tuesday – Wednesday): 9.00 – 5.00pm @ MIMOS Berhad, KL
· MS ISO/IEC 17025 Awareness Training
5 May 2015 (Tuesday): 9.00 – 5.00pm @ MIMOS Berhad, KL
· Six Sigma Green Belt Training
4 – 8 May 2015 (Monday – Friday) : 9.00am – 5.00pm @ MIMOS Berhad, KL
· Measurement System Analysis (MSA) Training
19 – 20 May 2015 (Tuesday – Wednesday) : 9.00am – 5.00pm @ MIMOS Berhad, KL
MIMOS TRAININGS AND SEMINARS ARE HRDF-SBL CLAIMABLE
Please share the above information and forward this e-mail to your colleagues and friends.
For registration or inquiry, please contact or email the following personnel
Amy Letchumy : Tel – 03 8995 5000 Ext. 55642 ( letc...@mimos.my)
Soon Yew Hee : Tel – 03 8995 5000 Ext. 56252 (yh....@mimos.my)
Website: http://semicon.mimos.my or www.mimos.my/semicon
FB: https://www.facebook.com/MimosWaferFabSemiconductorServices
MIMOS Analytical Services – One Stop Centre for Failure Analysis, Material Analysis, Reliability Testing and Advanced Semiconductor Skills Development Programmes.
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This e-mail (including any attachments) is for the addressee(s)
only and may contain confidential information. If you are not the
intended recipient, please note that any dealing, review,
distribution, printing, copying or use of this e-mail is strictly
prohibited. If you have received this email in error, please notify
the sender immediately and delete the original message.
MIMOS Berhad is a research and development institution under
the purview of the Malaysian Ministry of Science, Technology and
Innovation. Opinions, conclusions and other information in this e-
mail that do not relate to the official business of MIMOS Berhad
and/or its subsidiaries shall be understood as neither given nor
endorsed by MIMOS Berhad and/or its subsidiaries and neither
MIMOS Berhad nor its subsidiaries accepts responsibility for the
same. All liability arising from or in connection with computer
viruses and/or corrupted e-mails is excluded to the fullest extent
permitted by law.