Iec 61000-4

[Hermila Farquhar]

IEC61000-4-4 is the International Electrotechnical Commission's immunity standard based on electrical fast transient (EFT) / burst transients. This publication is part of the greater IEC 61000 group of standards which is covered under IEC TR 61000-4-1:2016.[1] The current third version of this standard (2012) replaces the second version (2004).[2] The goal of this standard is to establish a common and reproducible reference for evaluating the immunity of electrical and electronic equipment when subjected to electrical fast transient/bursts on supply, signal, control and earth ports.[3]

The cause of electrical fast transients (EFT) come from an arc when mechanical contact is open due to a switching process.[5] Given the fast rise time and voltage of these pulses having a solid ground connection is important during the testing process.[6] Testing for EFT often requires a capacitive coupling clamp (CCL), which is employed to add disturbances to nominal signals.[7]

1. The 6.5 V clamping voltage you're looking at in the electrical characteristics table is for surge, which is an 8/20 us pulse. ESD, which IEC 61000-4-2 is used for, is a 10/100 ns pulse, which is much shorter. For ESD clamping voltage, look at the TLP clamping voltage in the table. It is 5.5 V at 16 A. 16 A is equivalent to an 8 kV ESD event. You can read more about ESD clamping voltage here: _/b/powerhouse/posts/esd-fundamentals-part-3-clamping-voltage

2. When looking at the IEC 61000-4-2 waveform, it can be difficult trying to figure out what the clamping voltage will be. The first peak definitely seems high, but you also have to consider that it only stays at that high voltage for 1 ns or less. That's why you should look at the 30 ns data point to get a better idea of how the device will protect your system. In the ESDS314 data sheet, there is actually a diagram showing exactly how the device clamps an 8 kV IEC 61000-4-2 pulse. If you look at the 30 ns point, you'll see that its about 5.5 V.

From the above graphs in the datasheet, the negative voltage will be clamped at about -2.2V (from the second figure) and -5.5V if we consider the first graph, which is lower than the allowed -0.3V from the DRV8306 datasheet.

While it is always better to have the clamping voltage below the abs max rating of the part you are protecting, it is not always necessary. The abs max voltages in most device datasheets are for constant DC voltages ( i.e. voltages that last longer than a transient ESD event). The only way to really test this is to run a negative TLP curve across the device and see what voltage it fails at.

The ESD16 16.5kV ESD Simulator is suitable for performing EMI tests on systems in accordance with the standard IEC / EN 61000-4-2 , MIL-STD-461G CS118, RTCA/DO-160 Section 25, IEC 60601-1-2 and many other ESD test standards. Higher test levels can be set far beyond the standard limits. Depending on the test object and test setup, two test methods are to be used:

The contact discharge is the preferred test method since it is most reproducible. Air discharges are used when contact discharges are not possible - e.g. at plastic housings. The test voltages defined for each test method are shown in the table below:

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The EM Test CWS 500N4 is the state-of-the-art solution in a compact single-box design to test for immunity to conducted, common mode disturbances in the frequency range 0Hz (DC) to 165kHz. Such test requirements are specified in IEC 61000-4-16 and cover continuous mode testing as well as short term testing with DC, 16 2/3Hz, 50Hz and 60Hz with 4 test levels each plus a sweep mode from 10Hz to 165kHz. Additionally, the CWS 500N4 can be used for testing electricity metering equipment as per prTR 50579 and Draft standard IEC 61000-4-19, Annex C.

IEC 61000-4-2 is the most commonly called out ESD immunity compliance standard for commercial electronics required to attain CE Mark, UL, and other product certification. The full standard is not available for free but ESDGuns.com provides a brief overview below, and regularly consults it's customers on performing test and debugging for electrostatic discharge (ESD) immunity. Preview of IEC 61000-4-2 Compliance Test Standard for ESD Immunity, purchase the full version at the IEC website.

Electrostatic Discharge (ESD) is the phenomena that occurs when you rubbed your feet on the carpet and touched a doorknob. ESD happens everywhere, between high density electrical components found in just about everything manufactured today like your cellphone and television. The occurrence of ESD is impossible to predict, so the best method is to take as much preventative measures to prevent damage or malfunction when it does occur. Enter IEC 61000-4-2, the most commonly called out compliance standard for testing robustness and certifying commercial electronics. IEC 61000-4-2 is one of a handful EMC test standards that are required to attain a CE Mark, allowing you to sell your product into Europe (and makes it much easier to sell in most other countries). Below is a brief overview of the test levels performed when conforming to IEC 61000-4-2, for the detailed document you'll have to purchase it at the IEC website. Visit the Test Set-up and Waveform Verification pages for a general overview of ESD testing, the information should be sufficient for verifying your product before sending it to the test lab (pre-compliance).

IEC 61000-4-2:2008 relates to the immunity requirements and test methods for electrical and electronic equipment subjected to static electricity discharges, from operators directly, and from personnel to adjacent objects. It additionally defines ranges of test levels which relate to different environmental and installation conditions and establishes test procedures. The object of IEC 61000-4-2:2008 is to establish a common and reproducible basis for evaluating the performance of electrical and electronic equipment when subjected to electrostatic discharges. In addition, it includes electrostatic discharges which may occur from personnel to objects near vital equipment. IEC 61000-4-2:2008 defines typical waveform of the discharge current, range of test levels, test equipment, test setup, test procedure, calibration procedure and measurement uncertainty. IEC 61000-4-2:2008 gives specifications for test performed in "laboratories" and "post-installation tests" performed on equipment in the final installation. This second edition cancels and replaces the first edition published in 1995, its amendment 1 (1998) and its amendment 2 (2000) and constitutes a technical revision. It has the status of a basic EMC publication in accordance with IEC Guide 107. The main changes with respect to the first edition of this standard and its amendments are the following:

Voltage dips or sags as well as other power quality occurrences are not new events, however as more susceptible sensitive electronics and automated processes have been added to the power grid they have become more costly and require consideration during product development. These events impact both commercial and industrial customers connected to the power distribution grid impacting all connected devices.

Our discussion of voltage dips will focus on public supply networks and heavily on low-voltage distribution networks using IEC 61000-4-11, IEC 61000-2-8, and BS EN 50160 as references for the event and how it is tested. For additional information on this event please reference the resources/references below or EMCStandards which provides an excellent guide for IEC 61000-4-11 testing.

When describing this event type of event, the terms voltage sag and voltage dips are used interchangeably. The term "sag" is most commonly used in the US and IEEE while in Europe and other parts of the world "dip" is more commonly used(1).

This disturbance in power supply networks is commonly defined by the percentage decrease in voltage and time or number of cycles. The associated image illustrates a voltage dip of 70% of the RMS voltage over 10 cycles.

The timing involved in this event can vary from a 1/2 cycle to one minute, with dips longer than one minute being categorized as an under-voltage based upon EN 50160 and IEC 61000-4-30. The time associated with this event is commonly determined by how long it takes for the protective device to clear the over-current condition, commonly up to 10 cycles.(2)

The primary sources for a variety of different AC power quality-related issues including dips, swells, voltage variations, and dropouts come from load switching, faults, and motors starting. Low voltage, high voltage, and medium voltage three-phase distribution systems are all potential sources of these power quality issues.

Faults in the three-phase distribution systems can lead to voltage drops across all three phases, or if the fault is nonsymmetrical across any number of the phases. For additional information on both unbalanced and balanced voltage dips in three-phase systems, Mathe H. J. Bollen's paper does an excellent job of explaining further.

Faults and short circuits can be caused by a variety of different occurrences from both external factors and wear over time of electrical components. This can be seen in the breakdown of dielectric material designed as insulation between materials with different potentials. Other potential causes include:

As mentioned previously this occurrence is defined by the magnitude in percentage of normal RMS voltage and duration in time (typically in number of cycles). These two criteria will vary based upon the severity and location of the fault within the electrical system supply and the speed of the operation of protective devices (fused, relays, etc.).

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