ValueError: You have specified selection criteria, please provide the coordinates with a spring.db from previous segment or segmentrefine3d runs. This spring.db will be used for assessing the criteria.
Do I have to run the segment once with the all the micrographs to get the spring.db for micrograph selection?
Or is there a way to manually update the spring.db of the ctf. values so that I can modified the wrong defocus value determined from the first run with the correct value from the second run?
Thanks a lot,
Jing
Hi Catsten,After the micctfdetermine for 70 micrographs I noticed 5 of them show higher defocus than the range I set (0.5 to 5 um) and the pw of the result didn't match the data. I run the micctfdetermin again on those 5 micrographs only and their defocus are above 6 um. I'd like to exclude them for the segmentation by taking the advantage of the "micrographs selection option". In "sqlite3 spring.db .dump", I found the micrograph id corresponding to the bad micrographs to pass onto the micrographs selection. Here's the error from segment/report.log:ValueError: You have specified selection criteria, please provide the coordinates with a spring.db from previous segment or segmentrefine3d runs. This spring.db will be used for assessing the criteria.
Do I have to run the segment once with the all the micrographs to get the spring.db for micrograph selection?