Argon One M.2 Ssd Compatibility
Margarita Lovvorn
Hi all, I am having a strange issue with I2C code compatibility between Argon and P2 devices. I have been using an I2C scan function for development based on a code snippet from the Arduino project hub:
This works reliably, as expected on Argon hardware, showing the addresses of all connected devices. On P2 hardware, however, it incorrectly detects devices on every single I2C address. Observing the I2C pins with an oscilloscope shows no activity on SDA or SCL during the complete scan.
@peekay123 thanks for your quick response. Yes I do have pullups on both lines and also do have a Wire.begin() as part of the setup loop. My current test code has one particle function for the i2c scan and another to write to an I2C gpio expander output to toggle a LED (using the Wire lib). The gpio LED toggle function works and the corresponding SDA / SCL waveforms look very. Conversely running the i2c scan does not generate any I2C activity.
I have acutally built a couple of Featherwing compatible P2 boards, plugged into a breakout board so can quickly swap from an Argon hardware to P2 hardware with the only real change being the Particle processor.
Here is as I under stand it:
Pi5 PCIe to M2. nVME (more or less directly connected to the PCIe bus on the Pi5)
Pi4 USB to M2. SATA (has some chips to interface with USB and SATA)
So only M2.SATA disks can be used with the Pi4 Argon ONE Case
And the Raspberry Pi 5 only supports M2.nVME disks on the PCIe bus (with out some chips to interface with other types)
For Pi 4 Argon One NVME we use USB 3.0 to NVME conversion. The Asmedia chipset we use in that conversion have better compatibility with most SSD. Sadly for Raspberry Pi 5 using PCIe, there are certain SSD that are not compatible.
The Argon ONE V3 and NEO 5 M.2 NVME-PCIe Boards followed the specifications of the Raspberry Pi Trading on its PCIe, which is similar to how Pimoroni implemented it also in their drive, unlike PineBerry Drive.
The only difference between the Argon V3 version vs the NEO 5 version is that the Argon ONE V3 version has 2 POGO PINS for additional power support for the M.2 board, which is not available for the NEO 5 version.
However I have heard that some of them work - for testing it might be worth settting LATEST in raspi-config, advanced , then updating the bootloader so its on the latest version (rather than the current stable version) and then seeing whether it works or not.
The newest variation of the Phenom XL G2 desktop scanning electron microscope (SEM) was designed to be used in argon-filled gloveboxes to study materials that require non-reactive environmental conditions to prevent sample degradation. The compact footprint, easy workflow, and automation capabilities of the system enable the completion of a full SEM workflow inside a glovebox while maintaining conditions that minimize the risk of sample degradation. From sample preparation and imaging to performing elemental analysis (EDS), users can maintain sample integrity and complete experiments faster without sacrificing performance.
The Phenom XL G2 desktop SEM features the largest sample stage of any desktop SEM and delivers intuitive, automated solutions that eliminate manual repetitive tasks. The large chamber enables innovative solutions such as motorized eucentric sample tilting, in situ tensile testing, and electrical feedthrough capabilities. Dry-room and argon compatibility is available for placing the SEM in inert environments and protecting sensitive samples.
Phenoms are always ready for immediate operation with very low downtime. Unlike tungsten filament-based SEMs which require frequent replacements, electron source changes of Phenoms are far and few between due to incredibly long source lifetimes.
The backscattered electron detector (BSD) and secondary electron detector (SED) are responsible for detecting electrons resulting from interactions between the electron beam and sample surface. The two detectors collect different signals that convey varying information about atomic numbers and surface topography.
Energy dispersive X-ray spectroscopy (EDS) provides semi-quantitative elemental composition information by analyzing the X-rays released from atoms when irradiated with electrons. EDS is a non-destructive method for identifying compounds on micro and nanoscales, displayed through colorized elemental mapping.
The compatibility data that follows has been compiled to assist in evaluating appropriate materials for use in handling various gases. It is extremely important that all gas control equipment be compatible with the gas being used. The use of a device that is not compatible may damage the unit and cause a leak that could result in property damage or personal injury. To reduce potentially dangerous situations, always check for the compatibility of materials before using any gases in your gas control equipment.
This information is for experienced operators who know the general principles and the safety precautions to be observed in handling specialty gases and associated equipment. If you are not certain you fully understand these safety precautions, we urge you to obtain and read the applicable Material Safety Data Sheet (MSDS) and Equipment Instruction Booklet.
The information contained in the Compatibility Chart has been compiled by Linde from what it believes are authoritative sources and it is offered solely as a convenience to customers. While Linde believes that this information is accurate and factual as of the date of this publication, this information is intended to be used only as a guide in providing general information with respect to the products mentioned; and, therefore, it is not to be taken as a warranty or representation for which Linde assumes legal responsibility.
Note: These charts have been prepared for use with dry (anhydrous) gases at normal operating temperature of 70 F (21 C). Information may vary if different operating conditions exist. Systems and equipment used in oxidizer gas service (e.g., Oxygen or Nitrous Oxide) must be cleaned for oxygen service.
Argon is an inert, non-reactive gas, which means it does not engage with the wine or its components. Because of this property, argon is used in Coravin's wine preservation systems to protect still wines from oxidation without altering their taste or aroma. This ensures that each pour maintains the integrity and quality of the wine.
The next-generation Thermo Scientific Phenom XL G2 Desktop Scanning Electron Microscope (SEM) automates your quality control process, providing accurate, reproducible results while freeing up time for value-added work.
The Phenom XL G2 Desktop SEM features full-screen images and an average time-to image of 60 seconds. The unique CeB6 electron source offers a long lifetime with less maintenance. The small form factor requires little lab space, allowing you to place the microscope exactly where you need it.
The Thermo Scientific Phenom XL G2 Argon-Compatible Desktop Scanning Electron Microscope (SEM) automates your workflows while providing a stable, non-reactive environment for your reactive sample research.
The Phenom XL G2 Argon-Compatible Desktop SEM boasts the same 60-second time to image as the Phenom XL G2 SEM, while also being able to be placed in an argon glove box, assuring the safe analysis of solid state lithium.
The Phenom XL G2 Desktop SEM is standardly accessible via the Phenom Programming Interface (PPI), a powerful method for controlling the Phenom XL G2 Desktop SEM via Python scripting. If the user has a SEM workflow with repetitive work to analyze particles, pores, fibers or large SEM images, the instrument can do so automatically.
In many SEM applications, a user can gain more insight into sample properties if the sample can be tilted and rotated. The optional eucentric sample holder enables eucentric tilt and rotation, making research and analysis faster and more accurate.
The dedicated software package elemental identification software package (EID) is used to control the fully integrated EDS detector. The intuitive step-by-step process within the EID software helps the user to collect all X-ray results in an organized and structured way.
When placed in an argon glove box, this desktop SEM setup enables your research on solid state lithium batteries since it decreases the risk of sample volatility or sample degradation due to lithium oxidation.
The product selector is here to assist you in choosing the most suitable Scanning Electron Microscope (SEM) system and software for your research. Find out in a few minutes which SEM best suits your research application:
This on-demand webinar has been designed to help you decide which SEM best meets your unique needs. We present an overview of Thermo Fisher Scientific SEM technology for multi-user research labs and focus on how these wide-ranging solutions deliver performance, versatility, in situ dynamics and faster time to results. Watch this webinar if you are interested in:
Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.
Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.
Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.
c80f0f1006