C++TESK Testing ToolKit will be presented at the IP Track of the Design Automation Conference (DAC) - the premier conference for design and automation of electronic systems. The conference will take place on June 1-5 in San Francisco, CA, USA.
DAC offers outstanding training, education, exhibits and superb networking opportunities for designers, researchers, tool developers and vendors. The conference is sponsored by the Association for Computing Machinery (ACM), the Electronic Design Automation Consortium (EDA Consortium), and the Institute of Electrical and Electronics Engineers (IEEE), and is supported by ACM's Special Interest Group on Design. Read more...
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