ASQ RD August Webinars
Fred Schenkelberg
Parametric Reliability Analysis
August 8, 2013 09:00 US Pacific Coast Time
https://www1.gotomeeting.com/register/198102440
Presenter:
Dr. Alec Feinberg
Abstract
Many reliability engineers do not understand how to perform parametric reliability analysis. Yet it can save time, sample size, and money. As well, predictions can be more accurate from accelerated test data. And one does not even have to reach a failure threshold to make accurate predictions. That means time savings and lower acceleration stress can be used. Typically, what engineers alternately do is put a large number of devices on accelerated test and monitor key parameters and wait until enough devices that reach their failure threshold, say 15% tolerance change in Delta_P, then the analysis proceeds by using a traditional catastrophic approach like Weibull analysis. This seminar will provide details of how one can have another approach for doing parametric reliability analysis of test data and learn all its advantages:
- More efficient qualification testing
- Can obtain a point estimate even without failure
- Predict failure before it occurs
- testing to failure – not required
- Can establish aging law with a small sample size
- Lower stress levels
- More accurate predictions
- Quick feedback for design improvements
If time permits, Alec will also talk about his new research on thermodynamic parametric reliability analsysis.
Speaker’s Bio
Dr. Alec Feinberg is the founder of DfRSoft.com. He has a Ph.D. in Physics and is the principal author of the book,Design for Reliability and the reliability software tool DfRSoft. Alec has provided reliability engineering services in all areas of reliability and on numerous products in diverse industries that include solar, thin film power electronics, defense, microelectronics, aerospace, wireless electronics, and automotive electrical systems. Alec currently provides consulting and holds training classes on Design for Reliability and Quality, Understanding Shock and Vibration, and Advanced Electrostatic Discharge programs. Alec also works on improvements for the reliability software package DfRSoft. Alec has presented numerous technical papers and won the 2003 RAMS Alan O. Plait best tutorial award for the topic, “Thermodynamic Reliability Engineering”. He is currently working as contributing author for a new book on The Physics of Degradation in Engineering Devices and Machines.
Effective Reliability Testing to Drive Design Improvement (促进设计改善的有效可靠性试验)
August 17, 2013 19:00 US Pacific Coast Time
https://www1.gotomeeting.com/register/270659913
Presenter:
Dr. Keyanna Qi (齐彦博士)
Abstract
Reliability testing is critical for new component qualification, design change validation, or field failure simulation for root cause analysis. In many cases, with tight project schedules and scarce available resources, some important critical characteristics of a component or subsystem are overlooked. This will potentially result in new failure modes after implementing changes in production. The author will explain how to develop an effective test plan using the 6σ (Six Sigma) problem solving process, IDOV (Identify, Design, Optimize and Validation), to make the testing simple but efficient.
Speaker’s Bio
Dr. Keyanna Qi is currently a Senior Reliability and Test Engineer with Research Products Corporation, working in area of system reliability analysis, reliability growth plan and allocation, reliability testing (HALT, ALT and Qualification), field performance analysis and prediction. She received her B.S degree in Mechanical Engineering from Beijing Institute of Technology, and Ph.D. Degree in Mechanical Engineering from University of Toronto. She is an ASQ Certified Reliability Engineer (CRE) and Six Sigma Black Belt (CSSBB).