ASQ RD webinars in March
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Fred Schenkelberg
Feb 27, 2012, 1:00:46 PM2/27/12
to ASQ RD Webinars
WE have two events in March
one in English
Field Failure Analysis Using Root Cause Pattern Diagrams
Field Failure Analysis Using Root Cause Pattern Diagrams
PRESENTER: Bob Lloyd
DATE: Thursday, March 8, 2012, Noon - 1:00 pm EDT
DESCRIPTION: To effectively analyze issue root causes, it is crucial
that evidence is properly collected, coded, filtered and analyzed.
This presentation will outline proper data gathering and organizing
techniques. It will examine various analysis methods, comparing their
relative strengths and weaknesses. Lastly, it will introduce Root
Cause Pattern Diagrams, a breakthrough analysis technique that
displays data in colored graphical patterns that are compared against
a library of known root cause patterns.
Register now: https://www1.gotomeeting.com/register/723697136
and one in Mandarin
Understanding HALT Application in Desktop, Notebook, and Server (了解HALT
在桌面电脑、笔记本电脑、和服务器系统中的运用)
Understanding HALT Application in Desktop, Notebook, and Server (了解HALT
在桌面电脑、笔记本电脑、和服务器系统中的运用)
This event is in Mandarin
Danny LS Huang - Senior Reliability Engineer
Gerald Chang - Reliability Engineer
Jimmy Yang - Chief, Mfg Tech & Reliability Head
DATE:
Beijing Time: Mar 18, 2012; 10:00 am - 11:00AM --- convent time for
those in Asia
US Pacific Time: March 17, 2012; 6:00PM – 7:00PM
DESCRIPTION:
Application of HALT at design stage becomes more and more common in
electronics industry. Many discussions and disputations of the HALT
test interpretation are in full swing. With our HALT test experiences
in notebook, desktop and server products, we intend to share and
discuss the safety factor of exact product operating limits to its
operation specifications in temperature and vibration and common
failure modes stimulated thereby. A general perspective of the test
setup techniques by product types and its influence is also provided.
The distinctive roles of HALT on board level and system level from
thermal flow field point of view are also shared in this paper.
Register now: https://www1.gotomeeting.com/register/919280848
For more about all upcoming webinars and other events around the
world, visit
http://reliabilitycalendar.org
cheers,
Fred
Fred Schenkelberg
ASQ Webinar Executive Producer
f...@asqrd.org
one in English
Field Failure Analysis Using Root Cause Pattern Diagrams
Field Failure Analysis Using Root Cause Pattern Diagrams
PRESENTER: Bob Lloyd
DATE: Thursday, March 8, 2012, Noon - 1:00 pm EDT
DESCRIPTION: To effectively analyze issue root causes, it is crucial
that evidence is properly collected, coded, filtered and analyzed.
This presentation will outline proper data gathering and organizing
techniques. It will examine various analysis methods, comparing their
relative strengths and weaknesses. Lastly, it will introduce Root
Cause Pattern Diagrams, a breakthrough analysis technique that
displays data in colored graphical patterns that are compared against
a library of known root cause patterns.
Register now: https://www1.gotomeeting.com/register/723697136
and one in Mandarin
Understanding HALT Application in Desktop, Notebook, and Server (了解HALT
在桌面电脑、笔记本电脑、和服务器系统中的运用)
Understanding HALT Application in Desktop, Notebook, and Server (了解HALT
在桌面电脑、笔记本电脑、和服务器系统中的运用)
This event is in Mandarin
Danny LS Huang - Senior Reliability Engineer
Gerald Chang - Reliability Engineer
Jimmy Yang - Chief, Mfg Tech & Reliability Head
DATE:
Beijing Time: Mar 18, 2012; 10:00 am - 11:00AM --- convent time for
those in Asia
US Pacific Time: March 17, 2012; 6:00PM – 7:00PM
DESCRIPTION:
Application of HALT at design stage becomes more and more common in
electronics industry. Many discussions and disputations of the HALT
test interpretation are in full swing. With our HALT test experiences
in notebook, desktop and server products, we intend to share and
discuss the safety factor of exact product operating limits to its
operation specifications in temperature and vibration and common
failure modes stimulated thereby. A general perspective of the test
setup techniques by product types and its influence is also provided.
The distinctive roles of HALT on board level and system level from
thermal flow field point of view are also shared in this paper.
Register now: https://www1.gotomeeting.com/register/919280848
For more about all upcoming webinars and other events around the
world, visit
http://reliabilitycalendar.org
cheers,
Fred
Fred Schenkelberg
ASQ Webinar Executive Producer
f...@asqrd.org
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