Topic 1: ASQ Reliability Division Short Courses
Predicting Product Life Using Reliability Analysis Methods
PRESENTER: Steven Wachs
DATE: May 2, 2012 11:00 AM - 12:20 PM EDT
DESCRIPTION: Achieving high product reliability has become
increasingly vital for manufacturers in order to meet customer
expectations amid the threat of strong global competition. Poor
reliability can doom a product and jeopardize the reputation of a
brand or company. Inadequate reliability also presents financial
risks from warranty, product recalls, and potential litigation. When
developing new products, it is imperative that manufacturers develop
reliability specifications and utilize methods to predict and verify
that those reliability specifications will be met. This 4-Hour course
provides an overview of quantitative methods for predicting product
reliability from data gathered from physical testing or from field
data.
Register now:
https://www1.gotomeeting.com/register/737422600
Topic 2: ASQ Reliability Division Webinar Series
Design for Reliability (DFR) - A Case Study Using a Physics of Failure
(PoF)
PRESENTER: Dr. Haiyu Qi
DATE: Thursday, May 10, 2012, Noon - 1:00 pm EDT
DESCRIPTION: Design for reliability (DFR) is an industry-wide
practice and a philosophy of considering reliability in an early stage
of product design and development, to achieve a highly-reliable
product while with sustainable cost. Physical of Failure (PoF) is
recognized as a key approach of implementing DFR in a product design
and development process. The author will present a case study to
illustrate predicting and identifying product failure early in the
design phase with the help of a quantitative PoF model based analysis
tool.
Register now:
https://www1.gotomeeting.com/register/778853313
Topic 3: ASQ Reliability Division Webinar Series – Chinese Language
An Introduction to Quantification of Reliability-Centered Burn-In and
ESS (以可靠性为中心的老炼和环境应力筛选定量分析简介)
PRESENTER: Dr. Feng-Bin (Frank) Sun (孙凤斌博士)
DATE: Beijing Time: May 20, 2012; 10:00 am - 11:00AM
US Pacific Time: May 19, 2012; 6:00PM – 7:00PM
DESCRIPTION: When scientifically planned and conducted, Burn-In and
Environmental Stress Screening (ESS) provide one of the most effective
methods of reliability screening at the component, sub-assembly,
assembly, and system levels. Burn-in and ESS have been practiced in
industry for many years, yet they are often conducted without
scientific understanding, design, planning, quantification, and
optimization. Based on his two co-authored books in the subject, the
author of this talk presents a high-level introduction to the
quantification of reliability-centered Burn-In and ESS.
Register now:
https://www1.gotomeeting.com/register/9348035294