ASQ RD free webinars in February
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Fred Schenkelberg
Feb 3, 2012, 7:29:21 PM2/3/12
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Hi all,
Topic 1: ASQ Reliability Division Webinar Series - Introduction to Physics of Failure Reliability Methods
PRESENTER: James McLeish
DATE: Thursday, Feb 9, 2012, Noon - 1:00 pm EDT
DESCRIPTION:
Physics of Failure (also known as Reliability Physics) is a science-based approach for achieving Reliability by Design. The approach is based on research to identify and understand the processes that initiate and propagate mechanisms that ultimately results in failure. This knowledge when used in Computer Aided Engineering (CAE) durability simulations and reliability assessment can evaluate if a new design, under actual operating is susceptible to the root causes of failure such as fatigue, fracture, wear, and corrosion during the intended service life of the product.
This webinar compares classical reliability concepts and relates them to the PoF approach as applied to Electrical/Electronic (E/E) System and technologies. This webinar is intended for E/E Product Engineers, Validation/Test Engineers, Quality, Reliability and Product Assurance Personnel, CAE Modeling Analysts, R&D Staff and their supervisor
Register now: https://www1.gotomeeting.com/register/763231224
Topic 2: ASQ Reliability Division Chinese Webinar Series - Rapid Reliability Demonstration Tests (快速可靠性验证试验)
PRESENTER: Guangbin Yang (杨广斌)
DATE:
Beijing Time: Feb 19, 2012; 10:00 am - 11:00AM
DESCRIPTION:
In industry, bogey testing, also known as the zero-failure testing, is often used to demonstrate product reliability. This test method is simple to apply; however, it requires excessive test time and/or a large sample size, and thus is usually unaffordable. For some products whose failure is defined as a performance characteristic exceeding a threshold, it is possible to measure the performance characteristic during testing. The measurement data can be employed to predict whether or not a test unit will fail by the end of test. When there are sufficient data to make such a prediction with a high degree of confidence, the test of the unit can be terminated. As a result, the test time is reduced.
This presentation describes the test method, sample size computation, degradation models, and cost function for the lognormal bogey testing. Then the presentation discusses the optimum test plans, which choose the optimal sample size and the expected test time by minimizing the total test cost and simultaneously satisfying the constraints on the type II error and the available sample size. An example is given to illustrate the test method.
Register now: https://www1.gotomeeting.com/register/130299089
Missed a couple of months - busy with travel, holidays, etc. you know the drill.
Anyway, we have two free webinars planned for February.
Topic 1: ASQ Reliability Division Webinar Series - Introduction to Physics of Failure Reliability Methods
PRESENTER: James McLeish
DATE: Thursday, Feb 9, 2012, Noon - 1:00 pm EDT
DESCRIPTION:
Physics of Failure (also known as Reliability Physics) is a science-based approach for achieving Reliability by Design. The approach is based on research to identify and understand the processes that initiate and propagate mechanisms that ultimately results in failure. This knowledge when used in Computer Aided Engineering (CAE) durability simulations and reliability assessment can evaluate if a new design, under actual operating is susceptible to the root causes of failure such as fatigue, fracture, wear, and corrosion during the intended service life of the product.
This webinar compares classical reliability concepts and relates them to the PoF approach as applied to Electrical/Electronic (E/E) System and technologies. This webinar is intended for E/E Product Engineers, Validation/Test Engineers, Quality, Reliability and Product Assurance Personnel, CAE Modeling Analysts, R&D Staff and their supervisor
Register now: https://www1.gotomeeting.com/register/763231224
Topic 2: ASQ Reliability Division Chinese Webinar Series - Rapid Reliability Demonstration Tests (快速可靠性验证试验)
PRESENTER: Guangbin Yang (杨广斌)
DATE:
Beijing Time: Feb 19, 2012; 10:00 am - 11:00AM
DESCRIPTION:
In industry, bogey testing, also known as the zero-failure testing, is often used to demonstrate product reliability. This test method is simple to apply; however, it requires excessive test time and/or a large sample size, and thus is usually unaffordable. For some products whose failure is defined as a performance characteristic exceeding a threshold, it is possible to measure the performance characteristic during testing. The measurement data can be employed to predict whether or not a test unit will fail by the end of test. When there are sufficient data to make such a prediction with a high degree of confidence, the test of the unit can be terminated. As a result, the test time is reduced.
This presentation describes the test method, sample size computation, degradation models, and cost function for the lognormal bogey testing. Then the presentation discusses the optimum test plans, which choose the optimal sample size and the expected test time by minimizing the total test cost and simultaneously satisfying the constraints on the type II error and the available sample size. An example is given to illustrate the test method.
Register now: https://www1.gotomeeting.com/register/130299089
cheers,
Fred
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