19th IEEE LATS y 7th BELAS

[CoLo!]

Estimados,

Envío información sobre LATS2018 (19th IEEE Latin-American Test Symposium) que se desarrollará en San Pablo entre los días 12 y 14 de Marzo de 2018.

Para celebrar su 19 aniversario, LATS2018 organiza la 7ma Biannual European - Latin American Summer School on Design, Test and Reliability (BELAS2018), del 15 al 16 de marzo, en el mismo hotel y utilizando la misma infraestructura LATS. BELAS se organiza dos veces al año durante los veranos en los Hemisferios Norte y Sur. Distinguidos expertos de América Latina y del extranjero compartirán sus conocimientos con estudiantes de doctorado, maestría y post-doc. Para los asistentes a LATS, la cuota de participación a BELAS es gratuita. Además de asistir a los cursos, los estudiantes también están invitados a presentar su investigación en el PhD & MSc Forum, que tendrá lugar durante LATS.

Se invita a todos a participar del evento y se agradece difusión.

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Call-for-Papers: 19th IEEE Latin-American Test Symposium (LATS2018)

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The 19th IEEE Latin American Test Symposium (LATS2018) will be held in the city of Sao Paulo (Brazil) from 12th to 14th March 2018. LATS is a recognized forum for test, fault tolerance and security professionals and technologists from all over the world, in particular from Latin America, to present and discuss various aspects of system, board, and component testing, fault-tolerance and security with design, manufacturing and field considerations in mind. Presented papers are published in the IEEE Xplore Digital Library. The best papers of the 19th IEEE LATS will be invited to re-submit to a set of renowned journals:

- IEEE Design & Test,

- Journal of Electronic Testing: Theory and Applications - JETTA (Springer), 

- Journal of Low Power Electronics - JOLPE (American Scientific Publishers), and 

- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)

Please, visit the LATS2018 webpage on lats.tttc-events.org for details.

Important deadlines:

- Submission Deadline (Title and Abstract): November 25th, 2017 
- Submission Deadline (Full paper): December 9th, 2017
- Notification of Acceptance: January 13th, 2018 
- Camera Ready: January 27th, 2018

To celebrate its 19th anniversary, LATW2018 is hosting the 7th Biannual European - Latin American Summer School on Design, Test and Reliability (BELAS2018), from 15th to 16th March, in the same hotel and using the same LATS infrastructure. BELAS provides training in these three crucial areas of electronic circuits and systems. The series of BELAS events is organized during summer in the Northern and Southern Hemispheres. Distinguished experts from Latin America and abroad will share their knowledge with PhD, MSc students and Post-Docs. For those attending LATS, participation fee to BELAS is free of charge. In addition to attend the courses, students are also invited to present their research at the PhD & MSc Forum, to take place during LATS.

Technical Sponsors: 

The Institute of Electrical and Electronics Engineering, Inc.

IEEE Council on Electronic Design Automation - CEDA

General Chairs:

Fabian Vargas (PUCRS, Brazil) and Yervant Zorian (Synopsys, USA)
var...@computer.org, yervant.zor...@synopsys.com

Technical Progam Chairs:
Letícia Bolzani Poehls (PUCRS, Brazil) and Fernanda Kastensmidt (UFRGS, Brazil)
let...@poehls.com, fglima@inf.ufrgs.br

Past General Chair: 
Raoul Velazco – TIMA-INPG, France 

Tutorial Chairs: 
Matteo Sonza Reorda – Politecnico di Torino, Italy 
Tiago Balen – UFRGS, Brazil 

Panel Chairs: 
Said Hamdioui – Delft University of Technology, The Netherlands 
Ernesto Sanchez, Politecnico di Torino – Italy 

Publicity Chairs: 
Asia: Xiaoqing Won - KYUTECH, Japan 
Brazil: Eduardo Bezerra - UFSC, Brazil 
Europe: Giorgio Di Natale – LIRMM, France 
Latin America: Carlos Silva Cardenas – PUCP, Peru 
North America: Adit Singh – Auburn University, USA 

Publication Chair: 
Mario Schölzel – Univ. of Potsdam/IHP GmbH, Germany 

Local Chairs: 

Marcilei Aparecida G. da Silveira – FEI, Brazil 
Nilberto H. Medina – USP, Brazil 

TTTC’s E. J. McCluskey Best 2016 Latin American PhD Thesis Contest Organizer: 
José Lipovetzky – Instituto Balseiro, Argentina 

Industry Liaison: 
César Dueñas – NXP, Brazil 
Marcelo Lubaszewski – Tech.Park/UFRGS, Brazil 

IEEE-CEDA Liaison: Victor Champac – INAOE, Mexico 
JETTA-Springer Liaison: Vishwani Agrawal – Auburn University, USA
 IEEE TCAD Liaison: Vijaykrishnan Narayanan, Pennsylvania State University – USA 
JOLPE Liaison: Patrick Girard – LIRMM, France 
MERCOSUR Liaison: Gabriel Sanca – UNSAM, Argentina 

Steering Committee: 
Victor Champac – INAOE, Mexico
Marcelo Lubaszewski – UFRGS, Brazil
Fabian Vargas – PUCRS, Brazil
Raoul Velazco – TIMA-INPG, France 
Yervant Zorian – Synopsys, USA