Hi all,
I measured XRD data under Ag source and wanted to get X-PDF data. However, the XRD pattern of our doped sample has a additional background because of the absorption of the doped element as shown in fig. 1, which results in the low intensity of G(r) (fig. 2a). After highet normalization of the G(r), the PDF of the doped sample has suspicious additional ripples as shown in fig. 2b.
Could you please let me know if the strong background of the diffraction data influences the reliability of the PDF analysis result? If yes, how can I get rid of the strong background influence?
Thanking all,
Best,
Tong