Next week: Flannigan, 26-Nov-24, 12:20pm Central
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Ellad Tadmor
Nov 19, 2024, 10:46:41 AM11/19/24
to aem-solid...@umn.edu
AEM Mechanics Research Seminar
Tuesday 26-Nov-2024, 12:20pm Central
Prof. David J. Flannigan
Department of Chemical Engineering and Materials Science, University of Minnesota, Twin Cities
Title: Imaging Coherent Phonon Dynamics with Ultrafast Electron Microscopy
Abstract: Transmission electron microscopy (TEM) capabilities can be extended to the femtosecond (fs) timescale via coupling of a fs pulsed laser with an otherwise conventional TEM [1,2]. Here, I will describe the hardware components and the basics of operation of such an instrument, dubbed an ultrafast electron microscope (UEM). I will then share some examples of the types of measurements that can be done with UEM, focused especially on the direct nanometer-picosecond imaging of coherent phonon dynamics in semiconductors and 2D materials [3-6].
[1] A. H. Zewail, Science 328, 187 (2010).
[2] D. J. Flannigan, A. H. Zewail, Acc. Chem. Res. 45, 1828 (2012).
[3] D. R. Cremons, D. A. Plemmons, D. J. Flannigan, Nat. Commun. 7, 11230 (2016).
[4] D. R. Cremons, D. X. Du, D. J. Flannigan, Phys. Rev. Mater. 1, 073801 (2017).
[5] Y. Zhang, D. J. Flannigan, Nano Lett. 19, 8216 (2019).
[6] Y. Zhang, D. J. Flannigan, Nano Lett. 21, 7332 (2021).
For more information, visit the AEM Mechanics Research Seminar website:
Tuesday 26-Nov-2024, 12:20pm Central
In-person: Room 327, Akerman Hall, University of Minnesota
Online: Webinar registration link
Department of Chemical Engineering and Materials Science, University of Minnesota, Twin Cities
Title: Imaging Coherent Phonon Dynamics with Ultrafast Electron Microscopy
Abstract: Transmission electron microscopy (TEM) capabilities can be extended to the femtosecond (fs) timescale via coupling of a fs pulsed laser with an otherwise conventional TEM [1,2]. Here, I will describe the hardware components and the basics of operation of such an instrument, dubbed an ultrafast electron microscope (UEM). I will then share some examples of the types of measurements that can be done with UEM, focused especially on the direct nanometer-picosecond imaging of coherent phonon dynamics in semiconductors and 2D materials [3-6].
[1] A. H. Zewail, Science 328, 187 (2010).
[2] D. J. Flannigan, A. H. Zewail, Acc. Chem. Res. 45, 1828 (2012).
[3] D. R. Cremons, D. A. Plemmons, D. J. Flannigan, Nat. Commun. 7, 11230 (2016).
[4] D. R. Cremons, D. X. Du, D. J. Flannigan, Phys. Rev. Mater. 1, 073801 (2017).
[5] Y. Zhang, D. J. Flannigan, Nano Lett. 19, 8216 (2019).
[6] Y. Zhang, D. J. Flannigan, Nano Lett. 21, 7332 (2021).
For more information, visit the AEM Mechanics Research Seminar website:
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Ellad B. Tadmor, Ph.D.
Russell J. Penrose Professor
Department of Aerospace Engineering and Mechanics
University of Minnesota
https://dept.aem.umn.edu/~tadmor/
Russell J. Penrose Professor
Department of Aerospace Engineering and Mechanics
University of Minnesota
https://dept.aem.umn.edu/~tadmor/
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