CFP: Extended Deadline, SPIE-EUROPTO Conference
Manuel Trucco
*** D E A D L I N E E X T E N S I O N ***
Deadline extended to December 15.
* CALL FOR PAPERS * CALL FOR PAPERS * CALL FOR PAPERS * CALL FOR PAPERS *
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EUROPTO'99 Conference on
POLARIZATION AND COLOUR TECHNIQUES IN INDUSTRIAL INSPECTION
17-18 June 1999, Munich, Germany
(part of EOS/SPIE Symposium on Industrial Laser and Inspection)
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IMPORTANT DATES:
Abstracts are due by 15 December 1998
Manuscripts are due by 3 May 1999
CONFERENCE CHAIRS:
Elzbieta Marszalec, VTT (Finland), mailto:elzbieta....@vtt.fi
Emanuele Trucco, Heriot-Watt University (UK), mailto:m...@cee.hw.ac.uk
PAPER SUBMISSION:
See below for up-to-date information.
Further information available at the EUROPTO site: http://www.europto.org
PROGRAMME COMMITTEE:
David J Braunegg, The MITRE Corporation (USA);
Michael Brill, David Sarnoff Rsearch Center (USA);
Olle Hagman, Lulea Univ. of Tech. (Sweden);
Glenn Healey, Univ. of California (USA);
B Kosmowski, Tech. Univ. of Gdansk (Poland);
R Massen, Massen Mach.Vision Systs. (Germany);
Volker Mueller, MAZ Hamburg (Germany/China);
Paolo Nesi, Univ. of Florence (Italy);
J Parkkinen, Lappeenranta Univ. of Tech. (Finland);
Olli Silven, Univ. of Oulu (Finland);
Alessandro Verri, Univ. of Genoa (Italy);
Andrew M Wallace, Heriot-Watt Univ. (UK);
Lawrence B Wolff, Johns Hopkins Univ. (USA)
INVITED SPEAKERS:
R. Massen, Massen Machine Vision Systems (Germany)
Lawrence B. Wolff, Johns Hopkins University (USA)
CONFERENCE TOPICS
Recent developments in the theory and technology of colour and
polarization analysis, as well related advancements in hardware and
software for machine vision applications, are making colour and
polarization increasingly important tools for industrial inspection.
Neither techniques, however, can be considered consolidated technologies
for practical purposes. This conference aims to present the latest
solutions for colour and polarization analysis and measurement, their
applications, and to discuss the requirements of colour and
polarization-based inspection systems operating in real industrial
environments.
Papers reporting novel work on (but not limited to) the following topics
are solicited:
RGB vs multi-channel colour measurements
Colour-based inspection systems and quality control
Colour display technologies
Colour physics and analysis
Colour science for inspection applications
Colour representation: colour spaces and systems
Human vision vs industrial colour inspection
Colour surfaces: texture and colour
Colorimetric calibration
Polarization-based material discrimination
Polarization techniques for defect detection
Polarization-based surface analysis
Polarization systems in machine vision
Shape from polarization
Polarization techniques in laser scanning
The conference will include a POSTER SESSION.
******************* Abstract Submission ***************
YOUR ABSTRACT SHOULD INCLUDE THE FOLLOWING:
1. SUBMIT TO: Industrial Lasers & Inspection<Conference
Title, Conference Chair, "Conference Code: ind13"
2. ABSTRACT TITLE
3. AUTHOR LISTING (principal author first)
First (given) name, Last (family) name, affiliation, mailing address,
telephone, telefax, and e-mail address.
4. CORRESPONDENCE FOR EACH AUTHOR
5. PRESENTATION
Please indicate your preference for either "Oral Presentation" or
"Poster Presentation".
Placement is subject to chairs=92 discretion
6. KEY WORDS (3-5)
7. ABSTRACT TEXT: one full A4 page typed on white paper. The abstract
should be divided into background, materials and methods, results, and
discussion. Emphasize the main contribution of the
work; the original contribution with respect to the state of the art;
and include references to related papers from the same authors. Report
your results in detail.
8. BRIEF BIOGRAPHY (principal author only)
Approximately 50 to 100 words
CONDITIONS OF ACCEPTANCE
* Authors are expected to secure travel and accommodation funding,
independent of the organisers, through their sponsoring organisations
before submitting abstracts.
* Only original material should be submitted.
* Commercial papers, description of papers, with no research content,
and papers where supporting data or a technical description cannot be
given for proprietary reasons, will not be accepted for
presentation in this symposium.
* Abstracts should contain enough detail to clearly convey the approach
and the results of the research.
* Government and company clearance to present and publish should be
final at the time of submittal.
PAPER REVIEW
To ensure a high quality conference, all abstracts and Proceedings
papers will be reviewed by the conference chairs for technical merit and
content.
INSTRUCTIONS FOR SUBMITTING ABSTRACTS
Please choose only one of the three following options. Whichever method
you choose the abstract must be received by the due date :
* E-mail each abstract separately to:
de...@associationhq.com
in ASCII text (not encoded).
!!! IMPORTANT:
to ensure receipt and proper processing of your abstract,
the Subject line must include only the conference code.
Example: Subject: ind13.
Attachments in Word only please.
* OR mail three copies of your abstract to:
Industrial Lasers & Inspection
EUROPTO Series
Boulevard St. Michel 15,
B-1040 Brussels,
Belgium
* OR fax one copy to +32-2-743 15 50
(send each abstract separately).
PUBLISHING POLICY
Manuscript due dates must be strictly observed. Whether the conference
volume will be published before or after the meeting, late manuscripts
run the risk of not being published in the Proceedings. The
objective of this policy is to better serve the conference participants
and the technical community at large. Your cooperation in supporting
this objective will be appreciated by all.
PROCEEDINGS OF SPIE
These meetings will result in published Proceedings that can be ordered
through the Advance Programme. Manuscripts are required of all accepted
applicants and must be submitted in English by 12 February 1998.
Copyright to the manuscript is expected to be released
for publication in the conference Proceedings. Note: If an author does
not attend the meeting and make a presentation, the chair may
choose not to publish the author's manuscript in the conference volume.
Papers published are indexed in leading scientific databases including
INSPEC, Compendex Plus, Physics Abstracts, Chemical
Abstracts, International Aerospace Abstracts and Index to Scientific and
Technical Proceedings.
ORAL PRESENTATION
Each author is generally allowed 15 minutes plus a five-minute
discussion period. The following media equipment is provided free of
charge: 35 mm slide projectors, overhead projectors, and electric
pointers. Video and other equipment may be provided upon request.
ORAL OR POSTER PRESENTATION
Instructions for Oral and Poster presentations will be included in your
author kit. All Oral and Poster presentations are included in the
Proceedings and require a manuscript.
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For further information please contact:
EUROPTO Series
Industrial Lasers & Inspection
Boulevard St. Michel 15,
B-1040 Brussels,
Belgium
Phone: +32-2-743 15 73
Fax: +32-2-743 15 50
E-mail: de...@associationhq.com
http://www.europto.org
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