Thanks a lot for your explanation.
@ Phil Hobbs
my actual measurement
I have a two frequency HeNe circular polarized 1 mw HeNe laser. The
laser points to a retroreflector and comes back to my receiver for the
length measurement.
On top of the retro i have a beam splitter which spilts the beam. The
splitted beam hits a PSD to detect the spot position.
The detected spot position of the psd is sensitive to ambient light.
Now I want to measure the spot position with the PSD as good as
possible. I use a band pass filter with 25 nm band width but I have
still to much ambient light on my psd. The next thing I want to
investigate is to use a poliraziation filter too. But even when I have
no abient light on my PSD modulation of my HeNe laser without losing
the interferometer would be nice.
The next thing is that my retroreflector with the beam splitter and
the PSD tilts in the range of +/- 15°. That means that the angle of
incidence on my PSD with the filter changes in the same range. My PSD
is big enough to measure in this range the spot position but the
environmental influences are a problem. To use a CCD or CMOS sensor
could help me but the signal processing is more complex and I can't
reach the same measuring rate.
The polarization filter on my psd is the next thing I want to
investigate but I have to use filter components that allow me to
measure in the range of +/- 10°.
On 19 Jan., 21:56, Phil Hobbs <
pcdhSpamMeSensel...@electrooptical.net>