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seagate 2TB smartctl

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Wemif

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Apr 24, 2012, 10:54:39 AM4/24/12
to
Dwa miesiące temu wymienilem w RAID dysk na ST2000DM001-9YN164,
dzisiaj wypadł z raida, widzę w smart:

smartctl --all /dev/sda|grep Err
Error logging capability: (0x01) Error logging supported.
1 Raw_Read_Error_Rate 0x000f 119 100 006 Pre-fail Always
- 210508312
7 Seek_Error_Rate 0x000f 076 060 030 Pre-fail Always
- 46888419

Czy to prawda, że te dyski tak mają i to poprawne wartości?

a.

Krzysztof Magosa

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Apr 24, 2012, 3:03:05 PM4/24/12
to
W dniu 24.04.2012 16:54, Wemif pisze:
Device Model: ST2000DL003-9VT166

1 Raw_Read_Error_Rate 0x000f 109 099 006 Pre-fail
Always - 30848

7 Seek_Error_Rate 0x000f 077 060 030 Pre-fail
Always - 4353470942

Tomasz Jasiński

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Apr 26, 2012, 8:49:37 AM4/26/12
to
Wcale nie przypadkiem, dnia Tue, 24 Apr 2012 14:54:39 +0000 (UTC)
doszła do mnie wiadomość <jn6erf$ohi$1...@host.amsnet.pl>
od we...@amsnet.pl (Wemif) :
O ile pamiętam, dolne(LSB) 32 bity to "total number of seeks", 16
bitów na początku(MSB) to "total number of seek errors", ale to trzeba
by doczytać w dokumentacji Seagate, tak samo jest dla atrybutu 1.


>a.
--
Gdyby się wysadziło ich planety, zburzyło miasta,
spaliło księgi, a ich samych wytłukło do nogi,
może udałoby się ocalić naukę miłości bliźniego. SL.

grzehorz

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May 4, 2012, 7:36:41 AM5/4/12
to
Wemif wrote:

> Dwa miesiące temu wymienilem w RAID dysk na ST2000DM001-9YN164,
> dzisiaj wypadł z raida, widzę w smart:
>
> smartctl --all /dev/sda|grep Err
> Error logging capability: (0x01) Error logging supported.
> 1 Raw_Read_Error_Rate 0x000f 119 100 006 Pre-fail Always
> - 210508312

119 - to bieżąca wartość (VALUE)
100 - najgorsza wartość (WORST)
006 - próg - _poniżej_ którego nie powinny zejść powyższe wartości (THRESH)
210508312 - wartość której interpretację zna producent dysku (RAW_VALUE)
Tyle udało mi się kiedyś wyczytać...

> 7 Seek_Error_Rate 0x000f 076 060 030 Pre-fail Always
> - 46888419

- analogicznie

> Czy to prawda, że te dyski tak mają i to poprawne wartości?
>

Mi się wydaje, że poprawne.
Zrób test: smartctl -t short /dev/twojdysk,
ewentualnie dokładniejszy: smartctl -t long /dev/twojdysk

Jakieś tam dyski do których mam aktualnie dostęp:
Device Model: ST31000524AS
1 Raw_Read_Error_Rate 0x000f 114 099 006 Pre-fail
Always - 78007455
7 Seek_Error_Rate 0x000f 063 060 030 Pre-fail
Always - 2092122

Device Model: ST3250312AS
1 Raw_Read_Error_Rate 0x000f 116 100 006 Pre-fail
Always - 103341018
7 Seek_Error_Rate 0x000f 062 060 030 Pre-fail
Always - 1592942

Device Model: VB0250EAVER
1 Raw_Read_Error_Rate 0x002f 119 100 006 Pre-fail
Always - 215320055
7 Seek_Error_Rate 0x002f 061 060 030 Pre-fail
Always - 1434157

Device Model: VB0250EAVER
1 Raw_Read_Error_Rate 0x002f 117 099 006 Pre-fail
Always - 162239768
7 Seek_Error_Rate 0x002f 061 060 030 Pre-fail
Always - 1398223

Pozdrawiam
g.

Bartosz Bartczak

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Sep 21, 2012, 5:28:42 AM9/21/12
to
Co mam sadzi� o takich wynikach ?

# smartctl --all /dev/sda
smartctl version 5.37 [x86_64-redhat-linux-gnu] Copyright (C) 2002-6 Bruce
Allen
Home page is http://smartmontools.sourceforge.net/

=== START OF INFORMATION SECTION ===
Device Model: ST3250820NS
Serial Number: 9QE3B8RF
Firmware Version: 3.AEG
User Capacity: 250,058,268,160 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 7
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Fri Sep 21 11:25:13 2012 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection:
Enabled.
Self-test execution status: ( 0) The previous self-test routine
completed
without error or no self-test has
ever
been run.
Total time to complete Offline
data collection: ( 430) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off
support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 92) minutes.

SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED
WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 114 097 006 Pre-fail
s - 75664189
3 Spin_Up_Time 0x0003 095 095 000 Pre-fail
s - 0
4 Start_Stop_Count 0x0032 100 100 020 Old_age
ys - 115
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail
s - 0
7 Seek_Error_Rate 0x000f 087 060 030 Pre-fail
s - 570116372
9 Power_On_Hours 0x0032 059 059 000 Old_age
ys - 36656
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail
s - 0
12 Power_Cycle_Count 0x0032 100 100 020 Old_age
ys - 132
187 Unknown_Attribute 0x0032 100 100 000 Old_age
ys - 0
189 Unknown_Attribute 0x003a 100 100 000 Old_age
ys - 0
190 Temperature_Celsius 0x0022 059 049 045 Old_age
ys - 740687913
194 Temperature_Celsius 0x0022 041 051 000 Old_age
ys - 41 (Lifetime Min/Max 0/23)
195 Hardware_ECC_Recovered 0x001a 061 056 000 Old_age
ys - 201706813
197 Current_Pending_Sector 0x0012 100 100 000 Old_age
ys - 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age
line - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age
ys - 0
200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age
line - 0
202 TA_Increase_Count 0x0032 100 253 000 Old_age
ys - 0

SMART Error Log Version: 1
ATA Error Count: 320 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 320 occurred at disk power-on lifetime: 36293 hours (1512 days + 5
hours)
When the command that caused the error occurred, the device was active or
idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 01 2e 51 1c ed

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
37 ff 01 2e 51 1c ed 00 00:27:10.393 SET MAX ADDRESS EXT
27 ff 00 2e 51 1c e0 00 00:27:10.341 READ NATIVE MAX ADDRESS EXT
37 ff 00 2e 51 1c ed 00 00:27:03.684 SET MAX ADDRESS EXT
27 ff 01 2e 51 1c e0 00 00:27:03.637 READ NATIVE MAX ADDRESS EXT
37 ff 01 2e 51 1c ed 00 00:27:03.637 SET MAX ADDRESS EXT

Error 319 occurred at disk power-on lifetime: 36293 hours (1512 days + 5
hours)
When the command that caused the error occurred, the device was active or
idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 01 2e 51 1c ed

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
37 ff 01 2e 51 1c ed 00 00:27:10.393 SET MAX ADDRESS EXT
27 ff 00 2e 51 1c e0 00 00:27:10.341 READ NATIVE MAX ADDRESS EXT
37 ff 00 2e 51 1c ed 00 00:27:03.684 SET MAX ADDRESS EXT
27 ff 01 6f 59 1c e0 00 00:27:03.637 READ NATIVE MAX ADDRESS EXT
29 00 01 6f 59 1c e0 00 00:27:03.637 READ MULTIPLE EXT

Error 318 occurred at disk power-on lifetime: 34450 hours (1435 days + 10
hours)
When the command that caused the error occurred, the device was active or
idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 01 2e 51 1c ed

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
37 ff 01 2e 51 1c ed 00 00:03:49.337 SET MAX ADDRESS EXT
27 ff 00 2e 51 1c e0 00 00:03:49.337 READ NATIVE MAX ADDRESS EXT
37 ff 00 2e 51 1c ed 00 00:03:54.514 SET MAX ADDRESS EXT
27 ff 01 2e 51 1c e0 00 00:03:54.454 READ NATIVE MAX ADDRESS EXT
37 ff 01 2e 51 1c ed 00 00:03:54.238 SET MAX ADDRESS EXT

Error 317 occurred at disk power-on lifetime: 34450 hours (1435 days + 10
hours)
When the command that caused the error occurred, the device was active or
idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 01 2e 51 1c ed

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
37 ff 01 2e 51 1c ed 00 00:03:49.337 SET MAX ADDRESS EXT
27 ff 00 2e 51 1c e0 00 00:03:49.337 READ NATIVE MAX ADDRESS EXT
37 ff 00 2e 51 1c ed 00 00:03:49.337 SET MAX ADDRESS EXT
27 ff 01 6f 59 1c e0 00 00:03:49.337 READ NATIVE MAX ADDRESS EXT
29 00 01 6f 59 1c e0 00 00:03:49.336 READ MULTIPLE EXT

Error 316 occurred at disk power-on lifetime: 34296 hours (1429 days + 0
hours)
When the command that caused the error occurred, the device was active or
idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 01 2e 51 1c ed

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
37 ff 01 2e 51 1c ed 00 01:21:05.359 SET MAX ADDRESS EXT
27 ff 00 2e 51 1c e0 00 01:21:05.142 READ NATIVE MAX ADDRESS EXT
37 ff 00 2e 51 1c ed 00 01:21:05.080 SET MAX ADDRESS EXT
27 ff 01 2e 51 1c e0 00 01:21:04.942 READ NATIVE MAX ADDRESS EXT
37 ff 01 2e 51 1c ed 00 01:21:04.825 SET MAX ADDRESS EXT

SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours)
LBA_of_first_error
# 1 Extended offline Completed without error 00%
8 -
# 2 Short offline Completed without error 00%
8 -

SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.


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